瞬态外闭锁的布局灵敏度

2012 IEEE International Reliability Physics Symposium (IRPS) Pub Date : 2012-04-15 DOI:10.1109/IRPS.2012.6241821

A. Kripanidhi, E. Rosenbaum

{"title":"瞬态外闭锁的布局灵敏度","authors":"A. Kripanidhi, E. Rosenbaum","doi":"10.1109/IRPS.2012.6241821","DOIUrl":null,"url":null,"abstract":"The trigger current for external latchup depends on the duration of the triggering event. A physics-based model is provided to capture the effects of aggressor to victim spacing and orientation on transient triggering of external latchup. The latchup susceptibility of standard cell based designs is also investigated.","PeriodicalId":341663,"journal":{"name":"2012 IEEE International Reliability Physics Symposium (IRPS)","volume":"17 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":"{\"title\":\"Layout sensitivities of transient external latchup\",\"authors\":\"A. Kripanidhi, E. Rosenbaum\",\"doi\":\"10.1109/IRPS.2012.6241821\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The trigger current for external latchup depends on the duration of the triggering event. A physics-based model is provided to capture the effects of aggressor to victim spacing and orientation on transient triggering of external latchup. The latchup susceptibility of standard cell based designs is also investigated.\",\"PeriodicalId\":341663,\"journal\":{\"name\":\"2012 IEEE International Reliability Physics Symposium (IRPS)\",\"volume\":\"17 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-04-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"9\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2012 IEEE International Reliability Physics Symposium (IRPS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IRPS.2012.6241821\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 IEEE International Reliability Physics Symposium (IRPS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IRPS.2012.6241821","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 9

摘要

外部闭锁的触发电流取决于触发事件的持续时间。提出了一种基于物理的模型来捕捉攻击者与被攻击者的间距和方向对瞬态触发外锁的影响。研究了基于标准单元设计的闭锁敏感性。

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Layout sensitivities of transient external latchup

The trigger current for external latchup depends on the duration of the triggering event. A physics-based model is provided to capture the effects of aggressor to victim spacing and orientation on transient triggering of external latchup. The latchup susceptibility of standard cell based designs is also investigated.

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2012 IEEE International Reliability Physics Symposium (IRPS)

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