Junlin Li, Wei Chen, Wei Wu, Xiaoming Jin, Ruibin Li, Chao Qi, Minbo Liu, Yan Liu
{"title":"反应堆散裂和加速器中子源在纳米sram中诱导的SEU效应","authors":"Junlin Li, Wei Chen, Wei Wu, Xiaoming Jin, Ruibin Li, Chao Qi, Minbo Liu, Yan Liu","doi":"10.1109/icreed52909.2021.9588670","DOIUrl":null,"url":null,"abstract":"This paper presents the experimental research of neutron induced single event upset (SEU) in Nano-SRAMs which was carried out in CSNS (China Spallation Neutron Source), CIAE (China institute of atomic energy) and XAPR (Xi’an pulsed reactor). The SEU cross section of Nano-SRAMs with four different feature sizes were measured. Experimental results indicated that the neutron induced SEU cross section were heavily dependent on the feature size of SRAM and the data pattern written to SRAM had little impact on the SEU cross section. We compared experimental results of white neutrons from CSNS to 2.5Mev, 14MeV neutrons from CIAE and reactor neutrons from XAPR. The comparison results showed that the neutron induced SEU cross section had a strong dependence on the energy of incident neutron. And the SEU cross section of Nano-SRAMs varies with different feature sizes obtained from different neutron sources has the same tendency.","PeriodicalId":129675,"journal":{"name":"2021 4th International Conference on Radiation Effects of Electronic Devices (ICREED)","volume":"36 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"SEU effects induced by Reactor Spallation and Accelerator neutron sources in Nano-SRAMs\",\"authors\":\"Junlin Li, Wei Chen, Wei Wu, Xiaoming Jin, Ruibin Li, Chao Qi, Minbo Liu, Yan Liu\",\"doi\":\"10.1109/icreed52909.2021.9588670\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents the experimental research of neutron induced single event upset (SEU) in Nano-SRAMs which was carried out in CSNS (China Spallation Neutron Source), CIAE (China institute of atomic energy) and XAPR (Xi’an pulsed reactor). The SEU cross section of Nano-SRAMs with four different feature sizes were measured. Experimental results indicated that the neutron induced SEU cross section were heavily dependent on the feature size of SRAM and the data pattern written to SRAM had little impact on the SEU cross section. We compared experimental results of white neutrons from CSNS to 2.5Mev, 14MeV neutrons from CIAE and reactor neutrons from XAPR. The comparison results showed that the neutron induced SEU cross section had a strong dependence on the energy of incident neutron. And the SEU cross section of Nano-SRAMs varies with different feature sizes obtained from different neutron sources has the same tendency.\",\"PeriodicalId\":129675,\"journal\":{\"name\":\"2021 4th International Conference on Radiation Effects of Electronic Devices (ICREED)\",\"volume\":\"36 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-05-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2021 4th International Conference on Radiation Effects of Electronic Devices (ICREED)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/icreed52909.2021.9588670\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 4th International Conference on Radiation Effects of Electronic Devices (ICREED)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/icreed52909.2021.9588670","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
SEU effects induced by Reactor Spallation and Accelerator neutron sources in Nano-SRAMs
This paper presents the experimental research of neutron induced single event upset (SEU) in Nano-SRAMs which was carried out in CSNS (China Spallation Neutron Source), CIAE (China institute of atomic energy) and XAPR (Xi’an pulsed reactor). The SEU cross section of Nano-SRAMs with four different feature sizes were measured. Experimental results indicated that the neutron induced SEU cross section were heavily dependent on the feature size of SRAM and the data pattern written to SRAM had little impact on the SEU cross section. We compared experimental results of white neutrons from CSNS to 2.5Mev, 14MeV neutrons from CIAE and reactor neutrons from XAPR. The comparison results showed that the neutron induced SEU cross section had a strong dependence on the energy of incident neutron. And the SEU cross section of Nano-SRAMs varies with different feature sizes obtained from different neutron sources has the same tendency.