{"title":"一类一致容错网络的最短路径约简","authors":"Prashant D. Joshi, S. Hamdioui","doi":"10.1109/DFT.2014.6962102","DOIUrl":null,"url":null,"abstract":"Shortest path determination in a class of optimally fault tolerant networks designed using modified line graphs is described here. Appropriate node naming allows the shortest paths to be determined in 0(log n) steps. This is applicable even in the presence of node failures, without loops or backtracking. The stretch of the network is maintained at the theoretically minimum value possible of one.","PeriodicalId":414665,"journal":{"name":"2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","volume":"41 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Shortest path reduction in a class of uniform fault tolerant networks\",\"authors\":\"Prashant D. Joshi, S. Hamdioui\",\"doi\":\"10.1109/DFT.2014.6962102\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Shortest path determination in a class of optimally fault tolerant networks designed using modified line graphs is described here. Appropriate node naming allows the shortest paths to be determined in 0(log n) steps. This is applicable even in the presence of node failures, without loops or backtracking. The stretch of the network is maintained at the theoretically minimum value possible of one.\",\"PeriodicalId\":414665,\"journal\":{\"name\":\"2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)\",\"volume\":\"41 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DFT.2014.6962102\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DFT.2014.6962102","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Shortest path reduction in a class of uniform fault tolerant networks
Shortest path determination in a class of optimally fault tolerant networks designed using modified line graphs is described here. Appropriate node naming allows the shortest paths to be determined in 0(log n) steps. This is applicable even in the presence of node failures, without loops or backtracking. The stretch of the network is maintained at the theoretically minimum value possible of one.