{"title":"一种提高再生传感放大器动态电流测试可靠性的测试方案设计","authors":"S. Bracho","doi":"10.1109/IDDQ.1997.633009","DOIUrl":null,"url":null,"abstract":"A design for test method for improving dynamic supply current testing reliability on regenerative sense amplifier structures is described in this paper. This proposal uses a built-in current monitor to represent the supply current through the regenerative sense amplifier by a digital signature, externally analyzed by a digital tester. A fully differential fast comparator circuit has been used as a demonstrator to explore the effectiveness of the proposal. Different catastrophic faults at transistor level were considered and simulation results are discussed.","PeriodicalId":429650,"journal":{"name":"Digest of Papers IEEE International Workshop on IDDQ Testing","volume":"18 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-11-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"A design for test proposal for improving dynamic current testing reliability on regenerative sense amplifiers\",\"authors\":\"S. Bracho\",\"doi\":\"10.1109/IDDQ.1997.633009\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A design for test method for improving dynamic supply current testing reliability on regenerative sense amplifier structures is described in this paper. This proposal uses a built-in current monitor to represent the supply current through the regenerative sense amplifier by a digital signature, externally analyzed by a digital tester. A fully differential fast comparator circuit has been used as a demonstrator to explore the effectiveness of the proposal. Different catastrophic faults at transistor level were considered and simulation results are discussed.\",\"PeriodicalId\":429650,\"journal\":{\"name\":\"Digest of Papers IEEE International Workshop on IDDQ Testing\",\"volume\":\"18 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1997-11-05\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Digest of Papers IEEE International Workshop on IDDQ Testing\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IDDQ.1997.633009\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Digest of Papers IEEE International Workshop on IDDQ Testing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IDDQ.1997.633009","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A design for test proposal for improving dynamic current testing reliability on regenerative sense amplifiers
A design for test method for improving dynamic supply current testing reliability on regenerative sense amplifier structures is described in this paper. This proposal uses a built-in current monitor to represent the supply current through the regenerative sense amplifier by a digital signature, externally analyzed by a digital tester. A fully differential fast comparator circuit has been used as a demonstrator to explore the effectiveness of the proposal. Different catastrophic faults at transistor level were considered and simulation results are discussed.
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