失效缺陷建模——有效的失效分析仿真工具

2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Pub Date : 2016-07-18 DOI:10.1109/IPFA.2016.7564286

R. Mendaros, Arnulfo Evangelista, Jerome Paghasian

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引用次数: 0

摘要

失效缺陷建模(FDM)是一种软件仿真技术，它可以复制缺陷集成电路的失效模式和特征，从而缩小分析范围。FDM的结果指导分析人员选择合适的物理失效分析技术和工艺步骤，以成功地发现缺陷。

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Failure defect modeling — An effective failure analysis simulation tool

Failure defect modeling (FDM), a software simulation technique, replicates the failure mode and characteristic of a defective integrated circuit thus narrows down the analysis area. The results of FDM guides the analyst in the selection of the suitable physical failure analysis technique and process steps to successfully uncover the defect.

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2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

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