Changgui Tan, C. Siong, H. M. Reza, Hwang Chee Siang
{"title":"垂直NPN双极晶体管基底深体植入的研究","authors":"Changgui Tan, C. Siong, H. M. Reza, Hwang Chee Siang","doi":"10.1109/IEMT.2010.5746737","DOIUrl":null,"url":null,"abstract":"In this paper, we demonstrate the sensitivity of base resistance by different tilt angle of deep body implant into the base of Vertical NPN bipolar transistors. The base resistance in the vertical NPN bipolar transistors shows a strong dependency on the tilt angle of the boron implant from the deep body. We are able to improve the Early voltage (VEA) without degrading the current gain and breakdown voltage of collector and base on an optimal tilt angle of 0 degree.","PeriodicalId":133127,"journal":{"name":"2010 34th IEEE/CPMT International Electronic Manufacturing Technology Symposium (IEMT)","volume":"2 3 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A study of deep body implant into the base of Vertical NPN bipolar transistors\",\"authors\":\"Changgui Tan, C. Siong, H. M. Reza, Hwang Chee Siang\",\"doi\":\"10.1109/IEMT.2010.5746737\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, we demonstrate the sensitivity of base resistance by different tilt angle of deep body implant into the base of Vertical NPN bipolar transistors. The base resistance in the vertical NPN bipolar transistors shows a strong dependency on the tilt angle of the boron implant from the deep body. We are able to improve the Early voltage (VEA) without degrading the current gain and breakdown voltage of collector and base on an optimal tilt angle of 0 degree.\",\"PeriodicalId\":133127,\"journal\":{\"name\":\"2010 34th IEEE/CPMT International Electronic Manufacturing Technology Symposium (IEMT)\",\"volume\":\"2 3 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2010 34th IEEE/CPMT International Electronic Manufacturing Technology Symposium (IEMT)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IEMT.2010.5746737\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 34th IEEE/CPMT International Electronic Manufacturing Technology Symposium (IEMT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEMT.2010.5746737","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A study of deep body implant into the base of Vertical NPN bipolar transistors
In this paper, we demonstrate the sensitivity of base resistance by different tilt angle of deep body implant into the base of Vertical NPN bipolar transistors. The base resistance in the vertical NPN bipolar transistors shows a strong dependency on the tilt angle of the boron implant from the deep body. We are able to improve the Early voltage (VEA) without degrading the current gain and breakdown voltage of collector and base on an optimal tilt angle of 0 degree.