时序电路测试模式自动生成的有效故障排序

Proceedings of IEEE 3rd Asian Test Symposium (ATS) Pub Date : 1994-11-15 DOI:10.1109/ATS.1994.367244

P. A. Krauss, M. Henftling

{"title":"时序电路测试模式自动生成的有效故障排序","authors":"P. A. Krauss, M. Henftling","doi":"10.1109/ATS.1994.367244","DOIUrl":null,"url":null,"abstract":"This paper analyzes fault dependency in sequential circuits to accelerate parallel automatic test pattern generation (ATPG). We present the new algorithms improved fault collapsing and fault arranging for an efficient fault ordering to speedup ATPG. Experimental results obtained for sequential and fault parallel ATPG show the efficiency of the proposed methods.<<ETX>>","PeriodicalId":182440,"journal":{"name":"Proceedings of IEEE 3rd Asian Test Symposium (ATS)","volume":"2 2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-11-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"12","resultStr":"{\"title\":\"Efficient fault ordering for automatic test pattern generation for sequential circuits\",\"authors\":\"P. A. Krauss, M. Henftling\",\"doi\":\"10.1109/ATS.1994.367244\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper analyzes fault dependency in sequential circuits to accelerate parallel automatic test pattern generation (ATPG). We present the new algorithms improved fault collapsing and fault arranging for an efficient fault ordering to speedup ATPG. Experimental results obtained for sequential and fault parallel ATPG show the efficiency of the proposed methods.<<ETX>>\",\"PeriodicalId\":182440,\"journal\":{\"name\":\"Proceedings of IEEE 3rd Asian Test Symposium (ATS)\",\"volume\":\"2 2 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1994-11-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"12\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of IEEE 3rd Asian Test Symposium (ATS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ATS.1994.367244\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of IEEE 3rd Asian Test Symposium (ATS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.1994.367244","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 12

摘要

本文分析时序电路中的故障依赖关系，以加速并行自动测试图生成。我们提出了改进故障折叠和故障排列的新算法，以实现有效的故障排序，从而加快ATPG的速度。时序和故障并联ATPG的实验结果表明了该方法的有效性。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Efficient fault ordering for automatic test pattern generation for sequential circuits

This paper analyzes fault dependency in sequential circuits to accelerate parallel automatic test pattern generation (ATPG). We present the new algorithms improved fault collapsing and fault arranging for an efficient fault ordering to speedup ATPG. Experimental results obtained for sequential and fault parallel ATPG show the efficiency of the proposed methods.<>

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Proceedings of IEEE 3rd Asian Test Symposium (ATS)

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