数据驱动的超导逻辑故障模型开发

2020 IEEE International Test Conference (ITC) Pub Date : 2020-11-01 DOI:10.1109/ITC44778.2020.9325220

Mingye Li, Fangzhou Wang, S. Gupta

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引用次数: 3

摘要

超导技术的某些应用正在被认真地探索。我们提出了一种新的从大量模拟结果中导出断层模型的方法。对于该技术，我们的方法除了识别众所周知的卡滞故障外，还识别出了全新的故障模型——溢出、脉冲逃逸和模式敏感。

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Data-driven fault model development for superconducting logic

Superconducting technology is being seriously explored for certain applications. We propose a new clean-slate method to derive fault models from large numbers of simulation results. For this technology, our method identifies completely new fault models – overflow, pulse-escape, and pattern-sensitive – in addition to the well-known stuck-at faults.

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来源期刊

2020 IEEE International Test Conference (ITC)

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