K. Mashiko, K. Ueda, K. Nii, Y. Wada, T. Hirota, S. Maeda, T. Iwamatsu, Y. Yamaguchi, T. Ipposhi, S. Maegawa, H. Hamano
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引用次数: 0
摘要
只提供摘要形式。SOI/CMOS器件不仅适用于存储器lsi,也适用于逻辑lsi。最近的一些工作包括具有220-320 K可用门并在2.0 V供电电压下工作的门阵列。正如批量/CMOS器件的历史所表明的那样,市场将要求SOI/CMOS门阵列集成越来越多的门,并在越来越低的电源电压下工作,以降低功耗。本文介绍了一种1.0 V 560kg的SOI/CMOS门阵列,采用0.35 /spl mu/m的部分耗尽晶体管来满足这一需求。场屏蔽隔离技术能够充分稳定晶体管的体势,从而抑制浮体问题。此外,该技术消除了流经晶体管边缘的泄漏电流,从而抑制了在亚阈值泄漏水平下的待机电流。
A 0.35 /spl mu/m 560 KG SOI/CMOS gate array using field-shield isolation technique
Summary form only given. SOI/CMOS devices have been developed not only for memory LSIs but also for logic LSIs. Some of the recent works include gate arrays having 220-320 K usable gates and operating at a 2.0 V supply voltage. As the history of bulk/CMOS devices indicate, the market will demand SOI/CMOS gate array to integrate more and more gates and operate at lower and lower supply voltages to reduce power consumption. This paper describes a 1.0 V 560 KG SOI/CMOS gate array using 0.35 /spl mu/m partially-depleted transistors to meet this demand. The field-shield isolation technique stabilizes the body potential of transistors sufficiently to suppress the floating-body problems. Also the technique eliminates the leakage current flowing through the transistor edge to suppress the standby current under sub-threshold leakage-level.