{"title":"2度MSM光电探测器的微波特性","authors":"M. Tomáška, M. Marso, A. Fox, P. Kordos","doi":"10.1109/ASDAM.1998.730221","DOIUrl":null,"url":null,"abstract":"MSM photodetectors are investigated by measurement and modelling in microwave region. Cut-off frequencies are compared for different structures and layouts. Significant improvement of 2-DEG MSM's frequency response on low operating voltages was found.","PeriodicalId":378441,"journal":{"name":"ASDAM '98. Conference Proceedings. Second International Conference on Advanced Semiconductor Devices and Microsystems (Cat. No.98EX172)","volume":"39 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1998-10-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Microwave properties of the MSM photodetectors with 2-DEG\",\"authors\":\"M. Tomáška, M. Marso, A. Fox, P. Kordos\",\"doi\":\"10.1109/ASDAM.1998.730221\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"MSM photodetectors are investigated by measurement and modelling in microwave region. Cut-off frequencies are compared for different structures and layouts. Significant improvement of 2-DEG MSM's frequency response on low operating voltages was found.\",\"PeriodicalId\":378441,\"journal\":{\"name\":\"ASDAM '98. Conference Proceedings. Second International Conference on Advanced Semiconductor Devices and Microsystems (Cat. No.98EX172)\",\"volume\":\"39 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1998-10-05\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ASDAM '98. Conference Proceedings. Second International Conference on Advanced Semiconductor Devices and Microsystems (Cat. No.98EX172)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ASDAM.1998.730221\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ASDAM '98. Conference Proceedings. Second International Conference on Advanced Semiconductor Devices and Microsystems (Cat. No.98EX172)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASDAM.1998.730221","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Microwave properties of the MSM photodetectors with 2-DEG
MSM photodetectors are investigated by measurement and modelling in microwave region. Cut-off frequencies are compared for different structures and layouts. Significant improvement of 2-DEG MSM's frequency response on low operating voltages was found.