模拟电路的隐式功能测试

Chen-Yang Pan, K. Cheng
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引用次数: 39

摘要

我们提出了一种有效的线性时不变(LTI)模拟电路功能测试方法。通过使用适当的签名(脉冲响应样本)来推断性能参数的满足/违反规范(我们称之为隐式功能测试),仅基于少量签名,我们就可以实现90%以上的故障和产量覆盖率。我们使用伪随机技术来估计脉冲响应样本。我们的方法在测试设备成本和生产测试时间方面是有效的。我们还提供了仿真结果来说明估计脉冲响应样本的随机性对故障和产量覆盖率的影响。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Implicit functional testing for analog circuits
We propose an efficient approach to functional testing for linear time-invariant (LTI) analog circuits. By using proper signatures (impulse response samples) to infer the satisfaction/violation of the specifications for the performance parameters (we call such a procedure implicit functional testing), we can achieve over 90% fault and yield coverages based on only a small number of signatures. We use the pseudo-random technique to estimate the impulse response samples. Our approach is effective in terms of costs of test equipments and production testing time. We also present simulation results to illustrate the effects of the randomness of the estimated impulse response samples on the fault and yield coverages.
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