{"title":"顺序测试生成的最新进展","authors":"K. Cheng","doi":"10.1109/VTEST.1992.232759","DOIUrl":null,"url":null,"abstract":"The author gives a short review of recent developments in automatic test generation for sequential circuits. Approaches are classified according to the level of abstraction at which the circuit is described. The basic concepts, advantages, disadvantages, and application domains of representative methods of each class are discussed.<<ETX>>","PeriodicalId":434977,"journal":{"name":"Digest of Papers. 1992 IEEE VLSI Test Symposium","volume":"51 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-04-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Recent advances in sequential test generation\",\"authors\":\"K. Cheng\",\"doi\":\"10.1109/VTEST.1992.232759\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The author gives a short review of recent developments in automatic test generation for sequential circuits. Approaches are classified according to the level of abstraction at which the circuit is described. The basic concepts, advantages, disadvantages, and application domains of representative methods of each class are discussed.<<ETX>>\",\"PeriodicalId\":434977,\"journal\":{\"name\":\"Digest of Papers. 1992 IEEE VLSI Test Symposium\",\"volume\":\"51 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1992-04-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Digest of Papers. 1992 IEEE VLSI Test Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VTEST.1992.232759\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Digest of Papers. 1992 IEEE VLSI Test Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTEST.1992.232759","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The author gives a short review of recent developments in automatic test generation for sequential circuits. Approaches are classified according to the level of abstraction at which the circuit is described. The basic concepts, advantages, disadvantages, and application domains of representative methods of each class are discussed.<>
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