防止双节点干扰的六元交叉耦合SRAM单元

Aibin Yan, Yan Chen, Jun Zhou, Jie Cui, Tianming Ni, X. Wen, P. Girard
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引用次数: 3

摘要

在本文中,我们提出了一个六元交叉耦合SRAM单元,即SCCS18T,防止双节点干扰。由于所提出的SCCS18T单元形成了一个用于值保留和错误拦截的大反馈回路,因此该单元可以从任何单节点异常(snu)和部分双节点异常(dnu)中提供自恢复能力。此外,由于使用了六个存取晶体管,所提出的单元具有优化的运算速度。仿真结果表明,与典型的硬化SRAM单元相比,SCCS18T单元平均可节省约65%的读访问时间,功耗为49%,硅面积为50%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A Sextuple Cross-Coupled SRAM Cell Protected against Double-Node Upsets
In this paper, we propose a sextuple cross-coupled SRAM cell, namely SCCS18T, protected against double-node upsets. Since the proposed SCCS18T cell forms a large feedback loop for value retention and error interception, the cell can provide self-recoverability from any single-node upsets (SNUs) and partial double-node upsets (DNUs). Moreover, the proposed cell has optimized operation speed due to the use of six access transistors. Simulation results show that the SCCS18T cell can save approximately 65% read access time at the cost of 49% power dissipation and 50% silicon area on average, compared with typical hardened SRAM cells.
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