Kohei Akiyama, H. Nishimura, K. Anazawa, Akito Kishida, Nobuyuki Kasuga
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High-resolution analog measurement on mixed signal LSI tester
The authors describe the HP 9480, a mixed-signal LSI tester featuring LF source/measurement modules capable of measurements on the order of 100 dB for standard dynamic range, signal-to-noise ratio, or total harmonic distortion measurements. To realize this tester, background noise was minimized by using a unique power supply system and proper ground management, and several function modules were developed. The authors describe the noise reduction techniques and functional modules. Measurement examples are also given.<>
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