一种新型n+缓冲结构的高性能IGBT

H. Takahashi, Y. Ishimura, C. Yokoyama, H. Hagino, T. Yamada
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引用次数: 8

摘要

研制了一种新型n+缓冲结构的新型IGBT。新的n+缓冲层结构是在p+衬底与n+缓冲层的交界处形成若干n+埋藏层。n+埋藏层的浓度与p+基质的浓度几乎相同。采用新型n+缓冲结构的IGBT采用了第三代600v / 100a芯片。以VVVF逆变器为例,仅改变n+缓冲结构,产生的总功率损耗比传统IGBT减少12%左右。新型IGBT的短路安全操作区域与传统IGBT基本相似。此外,我们使用三维模拟器DAVINCI讨论了新型IGBT与传统IGBT的区别。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A high performance IGBT with new n+buffer structure
An advanced IGBT with a new n+buffer structure has been developed. The new n+buffer structure is that some n+buried layers are formed at the boundary between a p+substrate and a n+buffer layer. The concentration of the n+buried layers is almost the same as that of the p+substrate. The fabrication of the IGBT with the new n+buffer structure used a 3rd gen 600 V/100 A chip. Taking the VVVF inverter as an application, total power loss generated was about 12% less compared to the conventional IGBT, only changing the n+buffer structure. And the short circuit safe operating area of the new IGBT was almost similar to the conventional IGBT. Moreover, we discussed differences between the new IGBT and the conventional IGBT using a 3D simulator, DAVINCI.
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