A. García-Loureiro, N. Seoane, Julian G. Fernandez, E. Comesaña
{"title":"先进半导体晶体管的通用工具包:从模拟到机器学习","authors":"A. García-Loureiro, N. Seoane, Julian G. Fernandez, E. Comesaña","doi":"10.1109/LAEDC58183.2023.10209112","DOIUrl":null,"url":null,"abstract":"This work presents an overview of a set of inhouse-built software intended for state-of-the-art semiconductor device modelling, ranging from simulators to post-processing tools and prediction codes based on statistics and machine learning techniques. First, VENDES is a 3D finite-element based quantum-corrected semi-classical/classical toolbox able to characterise the performance, scalability, and variability of transistors. MLFoMPy is a Python-based tool that post-processes IV characteristics, extracting the most relevant figures of merit and preparing the data for subsequent statistical or machine learning studies. FSM is a variability prediction tool that also pinpoints the most sensitive regions of a device to the source of fluctuation. Finally, we also describe machine learning-based prediction tools that were used to obtain full IV curves and specific figures of merit of devices suffering the influence of several sources of variability.","PeriodicalId":151042,"journal":{"name":"2023 IEEE Latin American Electron Devices Conference (LAEDC)","volume":"48 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-07-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A general toolkit for advanced semiconductor transistors: from simulation to machine learning\",\"authors\":\"A. García-Loureiro, N. Seoane, Julian G. Fernandez, E. Comesaña\",\"doi\":\"10.1109/LAEDC58183.2023.10209112\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This work presents an overview of a set of inhouse-built software intended for state-of-the-art semiconductor device modelling, ranging from simulators to post-processing tools and prediction codes based on statistics and machine learning techniques. First, VENDES is a 3D finite-element based quantum-corrected semi-classical/classical toolbox able to characterise the performance, scalability, and variability of transistors. MLFoMPy is a Python-based tool that post-processes IV characteristics, extracting the most relevant figures of merit and preparing the data for subsequent statistical or machine learning studies. FSM is a variability prediction tool that also pinpoints the most sensitive regions of a device to the source of fluctuation. Finally, we also describe machine learning-based prediction tools that were used to obtain full IV curves and specific figures of merit of devices suffering the influence of several sources of variability.\",\"PeriodicalId\":151042,\"journal\":{\"name\":\"2023 IEEE Latin American Electron Devices Conference (LAEDC)\",\"volume\":\"48 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-07-03\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2023 IEEE Latin American Electron Devices Conference (LAEDC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/LAEDC58183.2023.10209112\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2023 IEEE Latin American Electron Devices Conference (LAEDC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/LAEDC58183.2023.10209112","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A general toolkit for advanced semiconductor transistors: from simulation to machine learning
This work presents an overview of a set of inhouse-built software intended for state-of-the-art semiconductor device modelling, ranging from simulators to post-processing tools and prediction codes based on statistics and machine learning techniques. First, VENDES is a 3D finite-element based quantum-corrected semi-classical/classical toolbox able to characterise the performance, scalability, and variability of transistors. MLFoMPy is a Python-based tool that post-processes IV characteristics, extracting the most relevant figures of merit and preparing the data for subsequent statistical or machine learning studies. FSM is a variability prediction tool that also pinpoints the most sensitive regions of a device to the source of fluctuation. Finally, we also describe machine learning-based prediction tools that were used to obtain full IV curves and specific figures of merit of devices suffering the influence of several sources of variability.