{"title":"某电源组件焊线寿命与有效应变法和粘结区法的比较","authors":"Jicheng Zhang, Yangjian Xu, Y. Liu","doi":"10.1109/EUROSIME.2014.6813798","DOIUrl":null,"url":null,"abstract":"In this paper, the cohesive zone model was used to simulate the stiffness degradation of interfaces between dies and solder joints in a power module. Subsequently, the fatigue life of the solder joints was predicted by the effective strain method. In addition, the cohesive zone model, collabrating with a modified paris' law, was further utilized to investigate the reliability of a wirebond model. At the same time, the effect of the cohesive zone model parameters on the reliability was studied.","PeriodicalId":359430,"journal":{"name":"2014 15th International Conference on Thermal, Mechanical and Mulit-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)","volume":"67 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-04-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Comparison of bondwire life with effective strain method and cohesive zone method for a power package\",\"authors\":\"Jicheng Zhang, Yangjian Xu, Y. Liu\",\"doi\":\"10.1109/EUROSIME.2014.6813798\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, the cohesive zone model was used to simulate the stiffness degradation of interfaces between dies and solder joints in a power module. Subsequently, the fatigue life of the solder joints was predicted by the effective strain method. In addition, the cohesive zone model, collabrating with a modified paris' law, was further utilized to investigate the reliability of a wirebond model. At the same time, the effect of the cohesive zone model parameters on the reliability was studied.\",\"PeriodicalId\":359430,\"journal\":{\"name\":\"2014 15th International Conference on Thermal, Mechanical and Mulit-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)\",\"volume\":\"67 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-04-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2014 15th International Conference on Thermal, Mechanical and Mulit-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EUROSIME.2014.6813798\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 15th International Conference on Thermal, Mechanical and Mulit-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EUROSIME.2014.6813798","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Comparison of bondwire life with effective strain method and cohesive zone method for a power package
In this paper, the cohesive zone model was used to simulate the stiffness degradation of interfaces between dies and solder joints in a power module. Subsequently, the fatigue life of the solder joints was predicted by the effective strain method. In addition, the cohesive zone model, collabrating with a modified paris' law, was further utilized to investigate the reliability of a wirebond model. At the same time, the effect of the cohesive zone model parameters on the reliability was studied.