嵌入式应用环境下汉明码和萧码的实验研究

2017 IEEE East-West Design & Test Symposium (EWDTS) Pub Date : 2017-09-01 DOI:10.1109/EWDTS.2017.8110065

Grigor Tshagharyan, Gurgen Harutunyan, S. Shoukourian, Y. Zorian

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引用次数: 13

摘要

软错误率的提高和技术节点尺寸的减小为纠错码在嵌入式系统中的广泛应用铺平了道路。根据应用程序安全目标、可接受的性能和区域开销，可以选择不同的代码。本文的目的是研究两种最突出的ECC码，Hamming和Hsiao，在嵌入式存储器的背景下的效率和便利性，并为它们的开发提供实践指导。

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Experimental study on Hamming and Hsiao codes in the context of embedded applications

Increasing soft error rate and decreasing technological nodes sizes pave a way for Error Correcting Codes (ECC) widespread use in embedded systems. Depending on application safety goals and acceptable performance and area overhead, different codes can be selected. The goal of this paper is to investigate the efficiency and expediency of two of the most prominent ECC codes, Hamming and Hsiao, in the context of embedded memories and provide practical guidance for their exploitation.

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2017 IEEE East-West Design & Test Symposium (EWDTS)

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