智能电子锁集成电路电磁干扰研究

Xuecheng Xu, Xiangjun Lu, Xie An
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引用次数: 0

摘要

针对特斯拉线圈对智能电子锁的电磁干扰,首先分析了特斯拉干扰器的结构和内部电路。然后,利用同轴电缆制作近场探头,模拟实际电路中闭环与作为接收天线的导线的电磁场耦合。结果表明,特斯拉干扰机的电磁场分布与空间位置、干扰频率和干扰方向有关。然后搭建集成电路电磁抗扰度测试平台,对智能电子锁主电路在不同空间角度、干扰频率和干扰幅值下的干扰进行测试。无论系统处于何种工作状态,EMI环境下IC的耦合效率在频率选择上是一致的,角度变化对IC引脚电磁耦合电压的影响呈现出特定的变化规律。最后,根据引脚耦合电压与干扰强度的变化规律,推断出任意干扰强度下IC引脚的电磁耦合效应。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Research on Electromagnetic Interference of Integrated Circuit for Intelligent Electronic Lock
In view of the electromagnetic interference (EMI) of Tesla coil on intelligent electronic lock, the structure and internal circuit of Tesla jammer were analyzed firstly. Then, a near-field probe was made by using coaxial cable to simulate the electromagnetic field coupling of the closed loop and the wire as receiving antenna in the actual circuit. The results show that the electromagnetic field distribution of Tesla jammer is related to the spatial position, interference frequency and interference direction. Then, the electromagnetic immunity test platform of integrated circuit (IC) was built to test the interference of master IC for intelligent electronic lock under different space angles, interference frequencies and interference amplitudes. Regardless of the working state of the system, the coupling efficiency of IC in EMI environment is consistent in frequency selection, and the influence of angle change on the electromagnetic coupling voltage of IC pins presents a specific change rule. Finally, the electromagnetic coupling effect of IC pins under any interference intensity was extrapolated based on the variation law of pin coupling voltage and interference intensity.
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