{"title":"我们能用能谱仪测定正常铝键板上的氟污染水平吗?","authors":"H. Younan","doi":"10.1109/IPFA.2018.8452520","DOIUrl":null,"url":null,"abstract":"IN this paper, the differences between EDS and AES are discussed. One can full understand what limitation of EDS technique is and why AES is better tool to determine F contamination on a normal Al bondpad. During application we cannot directly compare EDS result to AES result as EDS is a bulk analysis technique, while AES is surface analysis technique. For surface contamination analysis, a practice rule should be followed: “EDS clean is not clean” and “Auger clean is clean”. It is fully recommended for us to use AES to analyse and monitor surface F contamination level on a normal Al bondpad.","PeriodicalId":382811,"journal":{"name":"2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)","volume":"115 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Can We Use EDS to Determine Fluorine Contamination Level on A Normal Al Bondpad?\",\"authors\":\"H. Younan\",\"doi\":\"10.1109/IPFA.2018.8452520\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"IN this paper, the differences between EDS and AES are discussed. One can full understand what limitation of EDS technique is and why AES is better tool to determine F contamination on a normal Al bondpad. During application we cannot directly compare EDS result to AES result as EDS is a bulk analysis technique, while AES is surface analysis technique. For surface contamination analysis, a practice rule should be followed: “EDS clean is not clean” and “Auger clean is clean”. It is fully recommended for us to use AES to analyse and monitor surface F contamination level on a normal Al bondpad.\",\"PeriodicalId\":382811,\"journal\":{\"name\":\"2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)\",\"volume\":\"115 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-07-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IPFA.2018.8452520\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IPFA.2018.8452520","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Can We Use EDS to Determine Fluorine Contamination Level on A Normal Al Bondpad?
IN this paper, the differences between EDS and AES are discussed. One can full understand what limitation of EDS technique is and why AES is better tool to determine F contamination on a normal Al bondpad. During application we cannot directly compare EDS result to AES result as EDS is a bulk analysis technique, while AES is surface analysis technique. For surface contamination analysis, a practice rule should be followed: “EDS clean is not clean” and “Auger clean is clean”. It is fully recommended for us to use AES to analyse and monitor surface F contamination level on a normal Al bondpad.