{"title":"从TDR数据表征多导体非均匀耦合线","authors":"A. Tripathi, V. Tripathi","doi":"10.1109/EPEP.1997.634063","DOIUrl":null,"url":null,"abstract":"An algorithm to extract the normal mode parameters of uniformly coupled lines in an inhomogeneous medium is developed. The sufficiency of the measured multiport time domain reflection coefficient matrix elements in extracting all the normal mode parameters is exemplified with the example of typical coupled lines system.","PeriodicalId":220951,"journal":{"name":"Electrical Performance of Electronic Packaging","volume":"54 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-10-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Characterization of multiconductor inhomogeneous uniformly coupled lines from TDR data\",\"authors\":\"A. Tripathi, V. Tripathi\",\"doi\":\"10.1109/EPEP.1997.634063\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"An algorithm to extract the normal mode parameters of uniformly coupled lines in an inhomogeneous medium is developed. The sufficiency of the measured multiport time domain reflection coefficient matrix elements in extracting all the normal mode parameters is exemplified with the example of typical coupled lines system.\",\"PeriodicalId\":220951,\"journal\":{\"name\":\"Electrical Performance of Electronic Packaging\",\"volume\":\"54 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1997-10-27\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Electrical Performance of Electronic Packaging\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EPEP.1997.634063\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Electrical Performance of Electronic Packaging","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPEP.1997.634063","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Characterization of multiconductor inhomogeneous uniformly coupled lines from TDR data
An algorithm to extract the normal mode parameters of uniformly coupled lines in an inhomogeneous medium is developed. The sufficiency of the measured multiport time domain reflection coefficient matrix elements in extracting all the normal mode parameters is exemplified with the example of typical coupled lines system.
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