{"title":"使用测试子会话分区进行测试调度","authors":"D. Xiang","doi":"10.1109/ATS.1994.367252","DOIUrl":null,"url":null,"abstract":"The tester time is expensive, which should be reduced as much as possible. Considering the fact that test response observation and test application only use a fraction of the whole testing time, a test subsession partitioning scheme is offered. Therefore, some further sources of the test scheduling problem are used. Subcircuits in conflict according to the definition are only partially in conflict now. A new test scheduling algorithm is given after the test subsession partitioning scheme is combined. This algorithm has learning ability by recording the previous conflict information, which prunes the searching space of the test scheduling problem effectively.<<ETX>>","PeriodicalId":182440,"journal":{"name":"Proceedings of IEEE 3rd Asian Test Symposium (ATS)","volume":"126 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-11-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Test scheduling using test subsession partitioning\",\"authors\":\"D. Xiang\",\"doi\":\"10.1109/ATS.1994.367252\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The tester time is expensive, which should be reduced as much as possible. Considering the fact that test response observation and test application only use a fraction of the whole testing time, a test subsession partitioning scheme is offered. Therefore, some further sources of the test scheduling problem are used. Subcircuits in conflict according to the definition are only partially in conflict now. A new test scheduling algorithm is given after the test subsession partitioning scheme is combined. This algorithm has learning ability by recording the previous conflict information, which prunes the searching space of the test scheduling problem effectively.<<ETX>>\",\"PeriodicalId\":182440,\"journal\":{\"name\":\"Proceedings of IEEE 3rd Asian Test Symposium (ATS)\",\"volume\":\"126 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1994-11-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of IEEE 3rd Asian Test Symposium (ATS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ATS.1994.367252\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of IEEE 3rd Asian Test Symposium (ATS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.1994.367252","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Test scheduling using test subsession partitioning
The tester time is expensive, which should be reduced as much as possible. Considering the fact that test response observation and test application only use a fraction of the whole testing time, a test subsession partitioning scheme is offered. Therefore, some further sources of the test scheduling problem are used. Subcircuits in conflict according to the definition are only partially in conflict now. A new test scheduling algorithm is given after the test subsession partitioning scheme is combined. This algorithm has learning ability by recording the previous conflict information, which prunes the searching space of the test scheduling problem effectively.<>