外闭锁的研究

2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual Pub Date : 2007-04-01 DOI:10.1109/RELPHY.2007.369970

F. Farbiz, E. Rosenbaum

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引用次数: 6

摘要

电路在高温下更容易受到外部锁存的影响，这不仅是因为PNPN触发电流降低，还因为少数载流子收集效率提高。收集效率不与n阱的尺寸成线性比例。垂直于基板电流注入器的PNPN结构比平行于基板电流注入器的PNPN结构更容易发生闭锁

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An Investigation of External Latchup

Circuits are more susceptible to external latchup at elevated temperatures not only because the PNPN trigger current is lowered, but also because the minority carrier collection efficiency is increased. Collection efficiency does not scale linearly with the dimensions of the N-well. PNPN structures that are oriented perpendicular to a substrate current injector are more susceptible to latchup than are those oriented parallel

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2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual

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