基于现场条件,采用有限元法确定了BGA高速剪切试验的试验速度

C. Selvanayagam
{"title":"基于现场条件,采用有限元法确定了BGA高速剪切试验的试验速度","authors":"C. Selvanayagam","doi":"10.1109/ICEP.2016.7486844","DOIUrl":null,"url":null,"abstract":"Miniaturization and increased functionality has been the trend in the mobile electronic device industry. Inevitably, the drive for increased density of miniaturized components has led to the miniaturization of the BGA joints. Smaller joints, in general, have shorter lives as the crack propagation path is shorter. The high speed shear test is gaining popularity as a component-level test to ensure good outgoing solder joints. One advantage of this test over the static shear test is that higher test speeds induce brittle failure in the intermetallic layer (IMC) of the joint, similar to that in drop impact. As a result, this test can detect variations in substrate finishing quality and joint reflow conditions that could lead to premature drop impact failures. However, selection of test speed is critical. The general consensus is to test at the speed where IMC failures are induced. With recent advances in pad finishing and solder alloys resulting in thinner and more uniform IMC layers, testing at a speed where IMC failures occur could result in over-testing the device, well beyond the strain rates experienced in the field. This, in turn, would lead to the over-design of solder joints. Clearly, a method to determine equivalent shear test speed is required, where strain rates during shear test are matched to that in field conditions. This work presents a methodology to determine the equivalent shear test speed for high speed shear test based on shock and vibration requirements. FEA is used to match the maximum strain rates during the most severe impact or vibration application of the device to that during high speed shear test. Usage of the methodology is demonstrated on a board with a BGA component under three different drop conditions. Results show that for the three drop conditions, the equivalent shear speed is lower than 200mm/s. Given that the maximum capability of the tester is 4m/s, shear speed for high speed shear test needs to be selected carefully.","PeriodicalId":343912,"journal":{"name":"2016 International Conference on Electronics Packaging (ICEP)","volume":"62 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-04-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Using FEA to determine test speed for high speed shear test on BGA based on field conditions\",\"authors\":\"C. Selvanayagam\",\"doi\":\"10.1109/ICEP.2016.7486844\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Miniaturization and increased functionality has been the trend in the mobile electronic device industry. Inevitably, the drive for increased density of miniaturized components has led to the miniaturization of the BGA joints. Smaller joints, in general, have shorter lives as the crack propagation path is shorter. The high speed shear test is gaining popularity as a component-level test to ensure good outgoing solder joints. One advantage of this test over the static shear test is that higher test speeds induce brittle failure in the intermetallic layer (IMC) of the joint, similar to that in drop impact. As a result, this test can detect variations in substrate finishing quality and joint reflow conditions that could lead to premature drop impact failures. However, selection of test speed is critical. The general consensus is to test at the speed where IMC failures are induced. With recent advances in pad finishing and solder alloys resulting in thinner and more uniform IMC layers, testing at a speed where IMC failures occur could result in over-testing the device, well beyond the strain rates experienced in the field. This, in turn, would lead to the over-design of solder joints. Clearly, a method to determine equivalent shear test speed is required, where strain rates during shear test are matched to that in field conditions. This work presents a methodology to determine the equivalent shear test speed for high speed shear test based on shock and vibration requirements. FEA is used to match the maximum strain rates during the most severe impact or vibration application of the device to that during high speed shear test. Usage of the methodology is demonstrated on a board with a BGA component under three different drop conditions. Results show that for the three drop conditions, the equivalent shear speed is lower than 200mm/s. Given that the maximum capability of the tester is 4m/s, shear speed for high speed shear test needs to be selected carefully.\",\"PeriodicalId\":343912,\"journal\":{\"name\":\"2016 International Conference on Electronics Packaging (ICEP)\",\"volume\":\"62 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-04-20\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 International Conference on Electronics Packaging (ICEP)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICEP.2016.7486844\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 International Conference on Electronics Packaging (ICEP)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICEP.2016.7486844","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

小型化和增加功能一直是移动电子设备行业的趋势。不可避免地,对微型化部件密度增加的驱动导致了BGA接头的微型化。一般来说,较小的接头寿命较短,裂纹扩展路径也较短。高速剪切测试越来越受欢迎,作为一种组件级测试,以确保良好的外向焊点。与静态剪切试验相比,该试验的一个优点是,较高的试验速度会导致接头的金属间层(IMC)发生脆性破坏,类似于跌落冲击。因此,该测试可以检测到基材整理质量和接头回流条件的变化,这些变化可能导致过早的跌落冲击失效。然而,测试速度的选择是至关重要的。普遍的共识是,以导致IMC失效的速度进行测试。随着衬垫精加工和焊接合金的最新进展,IMC层变得更薄、更均匀,以IMC失效的速度进行测试可能会导致设备过度测试,远远超出现场所经历的应变率。这反过来又会导致焊点的过度设计。显然,需要一种确定等效剪切试验速度的方法,其中剪切试验期间的应变速率与现场条件相匹配。本文提出了一种基于冲击和振动要求确定高速剪切试验等效剪切试验速度的方法。有限元分析用于将设备在最严重的冲击或振动应用期间的最大应变率与高速剪切试验期间的最大应变率相匹配。在三种不同的下降条件下,在带有BGA组件的电路板上演示了该方法的使用。结果表明:三种降料条件下,等效剪切速度均小于200mm/s;考虑到试验机的最大能力为4m/s,高速剪切试验的剪切速度需要仔细选择。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Using FEA to determine test speed for high speed shear test on BGA based on field conditions
Miniaturization and increased functionality has been the trend in the mobile electronic device industry. Inevitably, the drive for increased density of miniaturized components has led to the miniaturization of the BGA joints. Smaller joints, in general, have shorter lives as the crack propagation path is shorter. The high speed shear test is gaining popularity as a component-level test to ensure good outgoing solder joints. One advantage of this test over the static shear test is that higher test speeds induce brittle failure in the intermetallic layer (IMC) of the joint, similar to that in drop impact. As a result, this test can detect variations in substrate finishing quality and joint reflow conditions that could lead to premature drop impact failures. However, selection of test speed is critical. The general consensus is to test at the speed where IMC failures are induced. With recent advances in pad finishing and solder alloys resulting in thinner and more uniform IMC layers, testing at a speed where IMC failures occur could result in over-testing the device, well beyond the strain rates experienced in the field. This, in turn, would lead to the over-design of solder joints. Clearly, a method to determine equivalent shear test speed is required, where strain rates during shear test are matched to that in field conditions. This work presents a methodology to determine the equivalent shear test speed for high speed shear test based on shock and vibration requirements. FEA is used to match the maximum strain rates during the most severe impact or vibration application of the device to that during high speed shear test. Usage of the methodology is demonstrated on a board with a BGA component under three different drop conditions. Results show that for the three drop conditions, the equivalent shear speed is lower than 200mm/s. Given that the maximum capability of the tester is 4m/s, shear speed for high speed shear test needs to be selected carefully.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信