Y. Yoshimoto, Y. Katoh, S. Ogasahara, Z. Wei, K. Kouno
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A ReRAM-based physically unclonable function with bit error rate < 0.5% after 10 years at 125°C for 40nm embedded application
This paper presents a secure application-a physically unclonable function (PUF)-that uses the physical property of resistive random access memory (ReRAM). The proposed PUF-generating method and reproducing algorithm achieves highly reliable with bit error rate (BER) <; 0.5% and reproduction exceeding 1010 times at -40 to 125°C after 10 years at 125°C and high uniqueness as evidenced by passing NIST tests. Evaluations on 40nm ReRAM test chips have demonstrated the feasibility of a scaled-down ReRAM cell enhanced with PUF.
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