HfO2 RRAM中SET和RESET的动态“钟形玻璃”模型

2012 Symposium on VLSI Technology (VLSIT) Pub Date : 2012-06-12 DOI:10.1109/VLSIT.2012.6242468

R. Degraeve, A. Fantini, S. Clima, B. Govoreanu, L. Goux, Yangyin Chen, D. Wouters, P. Roussel, G. Kar, G. Pourtois, S. Cosemans, J. Kittl, G. Groeseneken, M. Jurczak, L. Altimime

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引用次数: 95

摘要

建立了HfO2 RRAM的解析动态时玻璃模型，将复位描述为动态平衡过程，将复位描述为受离子迁移率和电流顺应性限制的收缩增长。对时间、电压和成形条件的依赖性与实验结果吻合较好。由于该模型是完全解析的，因此可以在电路模拟器中实现。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Dynamic ‘hour glass’ model for SET and RESET in HfO2 RRAM

An analytic dynamic hour glass model for HfO2 RRAM is demonstrated, describing the reset as a dynamic equilibrium process and the set as a constriction growth limited by ion mobility and current compliance. The dependence on time, voltage and forming conditions is in good constriction growth agreement with experiments. Since the model is fully analytical, it can be implemented in a circuit simulator.

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2012 Symposium on VLSI Technology (VLSIT)

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