2012 Symposium on VLSI Technology (VLSIT)

查看最新文献

1693

2012 Symposium on VLSI Technology (VLSIT) - 最新文献

Continuous characterization of MOSFET from low-frequency noise to thermal noise using a novel measurement system up to 100 MHz

Pub Date : 2012-06-12 DOI: 10.1109/VLSIT.2012.6242502 K. Ohmori, R. Hasunuma, W. Feng, K. Yamada

Sub-fM DNA sensitivity by self-aligned maskless thin-film transistor-based SoC bioelectronics

Pub Date : 2012-06-12 DOI: 10.1109/VLSIT.2012.6242494 Min-Cheng Chen, Chang-Hsien Lin, Chia-Yi Lin, F. Hsueh, Wen-Hsien Huang, Yu-Chung Lien, Hsiu-Chih Chen, Hsiao-Ting Hsueh, Che-Wei Huang, Chih-Ting Lin, Yin-Chih Liu, Ta-Hsien Lee, M. Hua, J. Qiu, Mao-Chen Liu, Yao-Jen Lee, J. Shieh, C. Ho, C. Hu, Fu-Liang Yang

Steep-slope tunnel field-effect transistors using III–V nanowire/Si heterojunction

Pub Date : 2012-06-12 DOI: 10.1109/VLSIT.2012.6242454 K. Tomioka, M. Yoshimura, T. Fukui

查看全部

免责声明：
本页显示期刊或杂志信息，仅供参考学习，不是任何期刊杂志官网，不涉及出版事务，特此申明。如需出版一切事务需要用户自己向出版商联系核实。若本页展示内容有任何问题，请联系我们，邮箱：info@booksci.cn，我们会认真核实处理。