{"title":"BIST的最新进展","authors":"S. Gupta","doi":"10.1109/VTEST.1992.232758","DOIUrl":null,"url":null,"abstract":"The author briefly reviews various recent results in data compression for BIST. His primary focus is on MISR compression, considering the practical design issues that interest a designer. Issues related to the choice of error model, feedback polynomial, and suitable test lengths are discussed.<<ETX>>","PeriodicalId":434977,"journal":{"name":"Digest of Papers. 1992 IEEE VLSI Test Symposium","volume":"178 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-04-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Recent advances in BIST\",\"authors\":\"S. Gupta\",\"doi\":\"10.1109/VTEST.1992.232758\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The author briefly reviews various recent results in data compression for BIST. His primary focus is on MISR compression, considering the practical design issues that interest a designer. Issues related to the choice of error model, feedback polynomial, and suitable test lengths are discussed.<<ETX>>\",\"PeriodicalId\":434977,\"journal\":{\"name\":\"Digest of Papers. 1992 IEEE VLSI Test Symposium\",\"volume\":\"178 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1992-04-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Digest of Papers. 1992 IEEE VLSI Test Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VTEST.1992.232758\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Digest of Papers. 1992 IEEE VLSI Test Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTEST.1992.232758","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The author briefly reviews various recent results in data compression for BIST. His primary focus is on MISR compression, considering the practical design issues that interest a designer. Issues related to the choice of error model, feedback polynomial, and suitable test lengths are discussed.<>
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