Pooja Choudhary, Lava Bhargava, M. Fujita, Virendra Singh
{"title":"基于lut的最坏情况相对误差形式保证算法电路逼近","authors":"Pooja Choudhary, Lava Bhargava, M. Fujita, Virendra Singh","doi":"10.1109/LATS58125.2023.10154494","DOIUrl":null,"url":null,"abstract":"We are presenting an automatic approach to produce approximate circuit with formal error guarantees on worst-case relative error (WCRE). The key concept is based on LUTs, SAT -based error evaluation, and property-checking techniques. These approximated circuits are employed to improve scalability and automate the designs for arithmetic circuits. The proposed 8 bit approximate multiplier shows an 83.33 % and 25.3 % decrease in power consumption and delay as w.r.t. exact multiplier. We demonstrated that the use of an approximate multiplier in FIR filter degrades SNR by 1.2 dB.","PeriodicalId":145157,"journal":{"name":"2023 IEEE 24th Latin American Test Symposium (LATS)","volume":"6 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-03-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"LUT-based Arithmetic Circuit Approximation with Formal Guarantee on Worst Case Relative Error\",\"authors\":\"Pooja Choudhary, Lava Bhargava, M. Fujita, Virendra Singh\",\"doi\":\"10.1109/LATS58125.2023.10154494\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We are presenting an automatic approach to produce approximate circuit with formal error guarantees on worst-case relative error (WCRE). The key concept is based on LUTs, SAT -based error evaluation, and property-checking techniques. These approximated circuits are employed to improve scalability and automate the designs for arithmetic circuits. The proposed 8 bit approximate multiplier shows an 83.33 % and 25.3 % decrease in power consumption and delay as w.r.t. exact multiplier. We demonstrated that the use of an approximate multiplier in FIR filter degrades SNR by 1.2 dB.\",\"PeriodicalId\":145157,\"journal\":{\"name\":\"2023 IEEE 24th Latin American Test Symposium (LATS)\",\"volume\":\"6 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-03-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2023 IEEE 24th Latin American Test Symposium (LATS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/LATS58125.2023.10154494\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2023 IEEE 24th Latin American Test Symposium (LATS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/LATS58125.2023.10154494","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
LUT-based Arithmetic Circuit Approximation with Formal Guarantee on Worst Case Relative Error
We are presenting an automatic approach to produce approximate circuit with formal error guarantees on worst-case relative error (WCRE). The key concept is based on LUTs, SAT -based error evaluation, and property-checking techniques. These approximated circuits are employed to improve scalability and automate the designs for arithmetic circuits. The proposed 8 bit approximate multiplier shows an 83.33 % and 25.3 % decrease in power consumption and delay as w.r.t. exact multiplier. We demonstrated that the use of an approximate multiplier in FIR filter degrades SNR by 1.2 dB.