C. Cai, Luchang Ding, Gengsheng Chen, Tianqi Liu, Dongqing Li, P. Zhao, Ze He, B. Ye, Jie Liu
{"title":"基于布局敏感体积法的硬化FPGA中SEU灵敏度评估","authors":"C. Cai, Luchang Ding, Gengsheng Chen, Tianqi Liu, Dongqing Li, P. Zhao, Ze He, B. Ye, Jie Liu","doi":"10.1109/ICREED49760.2019.9205163","DOIUrl":null,"url":null,"abstract":"DICE hardened configuration logics in million-gate FPGA were investigated. The rectangular parallelepiped models were established based on the material details and the layout of FPGA. Multiple sensitive volumes and charge collection weights were ascertained. The simulations were matched and further explained our heavy ion experiments.","PeriodicalId":124372,"journal":{"name":"2019 3rd International Conference on Radiation Effects of Electronic Devices (ICREED)","volume":"73 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Evaluation of SEU Sensitivity in Hardened FPGA on Layout-based Sensitive Volume Method\",\"authors\":\"C. Cai, Luchang Ding, Gengsheng Chen, Tianqi Liu, Dongqing Li, P. Zhao, Ze He, B. Ye, Jie Liu\",\"doi\":\"10.1109/ICREED49760.2019.9205163\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"DICE hardened configuration logics in million-gate FPGA were investigated. The rectangular parallelepiped models were established based on the material details and the layout of FPGA. Multiple sensitive volumes and charge collection weights were ascertained. The simulations were matched and further explained our heavy ion experiments.\",\"PeriodicalId\":124372,\"journal\":{\"name\":\"2019 3rd International Conference on Radiation Effects of Electronic Devices (ICREED)\",\"volume\":\"73 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-05-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 3rd International Conference on Radiation Effects of Electronic Devices (ICREED)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICREED49760.2019.9205163\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 3rd International Conference on Radiation Effects of Electronic Devices (ICREED)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICREED49760.2019.9205163","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Evaluation of SEU Sensitivity in Hardened FPGA on Layout-based Sensitive Volume Method
DICE hardened configuration logics in million-gate FPGA were investigated. The rectangular parallelepiped models were established based on the material details and the layout of FPGA. Multiple sensitive volumes and charge collection weights were ascertained. The simulations were matched and further explained our heavy ion experiments.