ASIC测试成本/策略权衡

Proceedings., International Test Conference Pub Date : 1994-10-02 DOI:10.1109/TEST.1994.527940

D. L. Wheater, P. Nigh, J. Mechler, Luke Lacroix

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引用次数: 8

摘要

为大型专用集成电路(asic)提供具有成本效益的测试是半导体行业面临的主要挑战之一。预测表明，继续目前的测试方向将不符合成本效益。ASIC供应商必须能够提供一套灵活、经济高效的测试解决方案，以满足各种客户需求。本文介绍了在开发最优测试策略时使用的一些权衡。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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ASIC test cost/strategy trade-offs

Supplying cost effective testing for large application specific integrated circuits (ASICs) is one of the key challenges facing the semiconductor industry. Projections suggest that it will not be cost effective to continue in the current test direction. ASIC suppliers must be able to offer a flexible, cost-effective set of test solutions that will meet a variety of customer requirements. This paper presents some of the trade-offs used in developing optimal test strategies.

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Proceedings., International Test Conference

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