{"title":"椭球细胞介电性能的rc -模型测定","authors":"S. Bunthawin, P. Wanichapichart","doi":"10.1109/NEMS.2007.352061","DOIUrl":null,"url":null,"abstract":"This work proposes an RC-model representing an ellipsoidal cell being induced in an AC electric field. The frequency dependent complex function of the induced cell dipole moment is expressed in terms of real and imaginary parts, which explains cell dielectric properties. This approach provides a simpler method so that only three values are required from experimentation. There are two critical frequencies at the lower (fclscr) and the higher (fch ) boundary which determine cross over points from negative to positive DEP force exerting on the cell and vice versa. By increasing the solution conductivity (sigmas), these frequencies converge and join as soon as the sigmas, reaches a critical value(sigmact). Under this critical conductivity the cell experiences a zero force, and the conductivity of the cytoplasm (sigmac) can be predicted. This work reveals permittivity and conductivity of the membrane and the cytoplasm of yeasts.","PeriodicalId":364039,"journal":{"name":"2007 2nd IEEE International Conference on Nano/Micro Engineered and Molecular Systems","volume":"12 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-04-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"An RC-Model for Dielectrophoresis of Ellipsoidal Cells: A Method for Determnination of Dielectric Properties\",\"authors\":\"S. Bunthawin, P. Wanichapichart\",\"doi\":\"10.1109/NEMS.2007.352061\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This work proposes an RC-model representing an ellipsoidal cell being induced in an AC electric field. The frequency dependent complex function of the induced cell dipole moment is expressed in terms of real and imaginary parts, which explains cell dielectric properties. This approach provides a simpler method so that only three values are required from experimentation. There are two critical frequencies at the lower (fclscr) and the higher (fch ) boundary which determine cross over points from negative to positive DEP force exerting on the cell and vice versa. By increasing the solution conductivity (sigmas), these frequencies converge and join as soon as the sigmas, reaches a critical value(sigmact). Under this critical conductivity the cell experiences a zero force, and the conductivity of the cytoplasm (sigmac) can be predicted. This work reveals permittivity and conductivity of the membrane and the cytoplasm of yeasts.\",\"PeriodicalId\":364039,\"journal\":{\"name\":\"2007 2nd IEEE International Conference on Nano/Micro Engineered and Molecular Systems\",\"volume\":\"12 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-04-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2007 2nd IEEE International Conference on Nano/Micro Engineered and Molecular Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/NEMS.2007.352061\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 2nd IEEE International Conference on Nano/Micro Engineered and Molecular Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NEMS.2007.352061","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
An RC-Model for Dielectrophoresis of Ellipsoidal Cells: A Method for Determnination of Dielectric Properties
This work proposes an RC-model representing an ellipsoidal cell being induced in an AC electric field. The frequency dependent complex function of the induced cell dipole moment is expressed in terms of real and imaginary parts, which explains cell dielectric properties. This approach provides a simpler method so that only three values are required from experimentation. There are two critical frequencies at the lower (fclscr) and the higher (fch ) boundary which determine cross over points from negative to positive DEP force exerting on the cell and vice versa. By increasing the solution conductivity (sigmas), these frequencies converge and join as soon as the sigmas, reaches a critical value(sigmact). Under this critical conductivity the cell experiences a zero force, and the conductivity of the cytoplasm (sigmac) can be predicted. This work reveals permittivity and conductivity of the membrane and the cytoplasm of yeasts.