基于RRAM矩阵运算的选择性校验和在线纠错

Abhishek Das, N. Touba
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引用次数: 5

摘要

电阻式RAM技术具有内存计算和矩阵向量乘法能力,为神经网络的高效硬件实现铺平了道路。存储训练权值并与应用的输入直接执行矩阵向量乘法从而直接产生输出的能力减少了大量内存传输开销。但由于制造工艺不成熟,容易产生各种软误差和硬误差,产生边缘单元,读取干扰误差等。在这种情况下,软错误是值得关注的,因为它们可能会导致对象的误分类,从而对安全关键应用程序造成灾难性后果。由于以前不知道软错误的位置,因此它们可能会在字段中出现,导致数据损坏。本文提出了一种基于部分校验和和选择性校验和的在线纠错方案。所提出的方案可以在给定RRAM矩阵的单列中纠正任意数量的错误。提出了两种不同的校验和计算方案:基于多数投票的方案和基于汉明码的方案。给出了两种方案的内存开销、译码面积、延迟和动态功耗。可以看出,所提出的解决方案可以实现低解码延迟和相对较小的内存和区域开销,以保证对单列错误的保护。最后,讨论了将该方法扩展到多列误差的方法。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Selective Checksum based On-line Error Correction for RRAM based Matrix Operations
Resistive RAM technology with it’s in memory computation and matrix vector multiplication capabilities has paved the way for efficient hardware implementations of neural networks. The ability to store the training weights and perform a direct matrix vector multiplication with the applied inputs thus producing the outputs directly reduces a lot of memory transfer overhead. But such schemes are prone to various soft errors and hard errors due to immature fabrication processes creating marginal cells, read disturbance errors, etc. Soft errors are of concern in this case since they can potentially cause mi-classification of objects leading to catastrophic consequences for safety critical applications. Since the location of soft errors are not known previously, they can potentially manifest in the field leading to data corruption. In this paper, a new on-line error correcting scheme is proposed based on partial and selective checksums which can correct errors in the field. The proposed scheme can correct any number of errors in a single column of a given RRAM matrix. Two different checksum computation schemes are proposed, a majority voting-based scheme and a Hamming code-based scheme. The memory overhead and decoding area, latency and dynamic power consumption for both the proposed schemes are presented. It is seen that the proposed solutions can achieve low decoding latency and comparatively smaller memory and area overhead in order to guarantee protection against errors in a single column. Lastly, a scheme to extend the proposed scheme to multiple column errors is also discussed.
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