真正的3D封装解决方案,堆叠垂直电源器件

N. Rouger, L. Benaissa, J. Widiez, B. Imbert, V. Gaude, S. Verrun, J. Crebier
{"title":"真正的3D封装解决方案,堆叠垂直电源器件","authors":"N. Rouger, L. Benaissa, J. Widiez, B. Imbert, V. Gaude, S. Verrun, J. Crebier","doi":"10.1109/ISPSD.2013.6694405","DOIUrl":null,"url":null,"abstract":"This paper presents recent advances and breakthroughs of an alternative 3D packaging solution for vertical power devices. Direct bonding technology and trench isolation used for power device islanding are the cornerstone of this scheme of integration. Involving direct copper bonding layers, the technology is used during the mid-process to enable the wafer level bonding of vertical power devices to a joint metallic substrate while optimizing the devices intrinsic performances. Wafer level islanding and interconnect is used to simplify and guarantee the true 3D assembly at module level. This 3D assembly is based on the interconnect of matrices of low side and high side vertical power devices on top of each other. Our technology optimizes component surface height as well as alignments constraints. As a result, the true 3D integration of the active parts for power converters is optimized to the highest possible level, leading to strongly reduced EMI levels and increased switching speed capabilities. Key challenges, both on design, fabrication and implementation are presented, and the first prototypes based on four switching cells of vertical 500V power diodes and MOSFETs are introduced.","PeriodicalId":175520,"journal":{"name":"2013 25th International Symposium on Power Semiconductor Devices & IC's (ISPSD)","volume":"11 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"True 3D packaging solution for stacked vertical power devices\",\"authors\":\"N. Rouger, L. Benaissa, J. Widiez, B. Imbert, V. Gaude, S. Verrun, J. Crebier\",\"doi\":\"10.1109/ISPSD.2013.6694405\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents recent advances and breakthroughs of an alternative 3D packaging solution for vertical power devices. Direct bonding technology and trench isolation used for power device islanding are the cornerstone of this scheme of integration. Involving direct copper bonding layers, the technology is used during the mid-process to enable the wafer level bonding of vertical power devices to a joint metallic substrate while optimizing the devices intrinsic performances. Wafer level islanding and interconnect is used to simplify and guarantee the true 3D assembly at module level. This 3D assembly is based on the interconnect of matrices of low side and high side vertical power devices on top of each other. Our technology optimizes component surface height as well as alignments constraints. As a result, the true 3D integration of the active parts for power converters is optimized to the highest possible level, leading to strongly reduced EMI levels and increased switching speed capabilities. Key challenges, both on design, fabrication and implementation are presented, and the first prototypes based on four switching cells of vertical 500V power diodes and MOSFETs are introduced.\",\"PeriodicalId\":175520,\"journal\":{\"name\":\"2013 25th International Symposium on Power Semiconductor Devices & IC's (ISPSD)\",\"volume\":\"11 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-05-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2013 25th International Symposium on Power Semiconductor Devices & IC's (ISPSD)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISPSD.2013.6694405\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 25th International Symposium on Power Semiconductor Devices & IC's (ISPSD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISPSD.2013.6694405","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3

摘要

本文介绍了垂直电源器件替代3D封装解决方案的最新进展和突破。直接键合技术和用于功率器件孤岛的沟槽隔离是该集成方案的基石。该技术涉及直接铜键合层,在中间工艺中用于实现垂直功率器件与连接金属基板的晶圆级键合,同时优化器件的固有性能。晶圆级孤岛和互连,以简化和保证真正的3D组装在模块级。这种3D组装是基于低侧和高侧垂直功率器件相互顶部的矩阵互连。我们的技术优化了组件表面高度以及对齐限制。因此,电源转换器有源部件的真正3D集成被优化到尽可能高的水平,从而大大降低了EMI水平并提高了开关速度能力。提出了设计、制造和实现方面的关键挑战,并介绍了基于垂直500V功率二极管和mosfet的四个开关单元的第一个原型。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
True 3D packaging solution for stacked vertical power devices
This paper presents recent advances and breakthroughs of an alternative 3D packaging solution for vertical power devices. Direct bonding technology and trench isolation used for power device islanding are the cornerstone of this scheme of integration. Involving direct copper bonding layers, the technology is used during the mid-process to enable the wafer level bonding of vertical power devices to a joint metallic substrate while optimizing the devices intrinsic performances. Wafer level islanding and interconnect is used to simplify and guarantee the true 3D assembly at module level. This 3D assembly is based on the interconnect of matrices of low side and high side vertical power devices on top of each other. Our technology optimizes component surface height as well as alignments constraints. As a result, the true 3D integration of the active parts for power converters is optimized to the highest possible level, leading to strongly reduced EMI levels and increased switching speed capabilities. Key challenges, both on design, fabrication and implementation are presented, and the first prototypes based on four switching cells of vertical 500V power diodes and MOSFETs are introduced.
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