{"title":"可控性和可观察性在测试设计中的作用","authors":"K. Butler, R. Kapur, M. R. Mercer, D. Ross","doi":"10.1109/VTEST.1992.232754","DOIUrl":null,"url":null,"abstract":"The nature of many problems related to testability requires detailed information about their underlying test parameters. These parameters are commonly referred to as controllability and observability. This research concerns exact measures of detectability, controllability, and observability to measure the relative importance of the latter two on the likelihood of the former. New functional methods for fault analysis are utilized which allow computations not previously possible; the empirical results presented here are an example of such an application.<<ETX>>","PeriodicalId":434977,"journal":{"name":"Digest of Papers. 1992 IEEE VLSI Test Symposium","volume":"7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-04-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"The roles of controllability and observability in design for test\",\"authors\":\"K. Butler, R. Kapur, M. R. Mercer, D. Ross\",\"doi\":\"10.1109/VTEST.1992.232754\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The nature of many problems related to testability requires detailed information about their underlying test parameters. These parameters are commonly referred to as controllability and observability. This research concerns exact measures of detectability, controllability, and observability to measure the relative importance of the latter two on the likelihood of the former. New functional methods for fault analysis are utilized which allow computations not previously possible; the empirical results presented here are an example of such an application.<<ETX>>\",\"PeriodicalId\":434977,\"journal\":{\"name\":\"Digest of Papers. 1992 IEEE VLSI Test Symposium\",\"volume\":\"7 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1992-04-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Digest of Papers. 1992 IEEE VLSI Test Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VTEST.1992.232754\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Digest of Papers. 1992 IEEE VLSI Test Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTEST.1992.232754","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The roles of controllability and observability in design for test
The nature of many problems related to testability requires detailed information about their underlying test parameters. These parameters are commonly referred to as controllability and observability. This research concerns exact measures of detectability, controllability, and observability to measure the relative importance of the latter two on the likelihood of the former. New functional methods for fault analysis are utilized which allow computations not previously possible; the empirical results presented here are an example of such an application.<>