高分辨率抗蚀剂中聚(4-羟基苯乙烯)溶解动力学的基础研究

A. Nakajima, Kyoko Watanabe, Kyoko Matsuoka, T. Kozawa, Yoshitaka Komuro, Daisuke Kawana, A. Yamazaki
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引用次数: 3

摘要

研究了聚(4-羟基苯乙烯)(PHS)在含四甲基氢氧化铵(TMAH)碱显影剂中的溶解动力学。使用不同分子量的小PHS和不同分子量的分散体以及不同浓度的TMAH显影剂进行实验,澄清了溶解行为。随着显影剂浓度的变化,不仅溶解时间发生了变化,而且溶解行为也发生了变化。溶解行为取决于根据表明溶胀和溶解作用的值计算的指数。溶解是通过聚合物体的膨胀和随后的聚合物链扩散到溶液体中发生的。碱水溶液体系的开发较为复杂。由于高溶胀率会导致在精细结构制造过程中产生缺陷,因此开发高分辨率电阻时溶胀率不应大于溶解率。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Fundamental study on dissolution kinetics of poly(4-hydroxystyrene) for development of high-resolution resists
We investigated the dissolution kinetics of poly(4-hydroxystyrene) (PHS) in an alkali developer with tetramethylammoniumhydroxide (TMAH). Experiments using PHS with different molecular weights and molecular weight dispersions and developer with different concentrations of TMAH led to the clarification of the dissolution behavior. Not only a change in the dissolution time but also a change in the dissolution behavior was observed upon changing the concentration of the developer. The dissolution behavior depends on an index calculated from values indicating the effects of swelling and dissolving. The dissolution occurred through the swelling of the polymer bulk and the subsequent diffusion of polymer chains into the solution bulk. The development using the alkali aqueous solution system was complex. The swelling rate should not be much larger than the dissolving rate for the development of high-resolution resists because a high swelling rate causes the generation of defects during the fabrication of fine structures.
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