T. Letavic, J. Petruzzello, J. Claes, P. Eggenkamp, E. Janssen, A. B. van der Wal
{"title":"用于开关电源的650V SOI灯","authors":"T. Letavic, J. Petruzzello, J. Claes, P. Eggenkamp, E. Janssen, A. B. van der Wal","doi":"10.1109/ISPSD.2006.1666145","DOIUrl":null,"url":null,"abstract":"This paper presents a thin-layer high voltage silicon-on-insulator conductivity modulated device which has been optimized for use within integrated switch mode power supply applications. The device contains a linearly-graded charge profile in the drift region, and the fast-switching LIGBT can be used at current densities which are at least a factor-of-two greater than the SOI LDMOS of equivalent breakdown voltage (LIGBT BVds 650V/Rsp 4 ohm mm2). A device failure mechanism which occurs during shorted-winding SMPS transients unique to thin-layer devices has been documented, and device protection circuitry has been developed to provide a transient current limit mechanism within the high voltage device. The electrical characteristics of the protected conductivity modulated thin-layer SOI high voltage device are comparable to state-of-the-art discrete components, and as such this process technology provides a monolithic alternative for miniaturization and integration of switch mode power supply topologies","PeriodicalId":198443,"journal":{"name":"2006 IEEE International Symposium on Power Semiconductor Devices and IC's","volume":"30 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-06-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"39","resultStr":"{\"title\":\"650V SOI LIGBT for Switch-Mode Power Supply Application\",\"authors\":\"T. Letavic, J. Petruzzello, J. Claes, P. Eggenkamp, E. Janssen, A. B. van der Wal\",\"doi\":\"10.1109/ISPSD.2006.1666145\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a thin-layer high voltage silicon-on-insulator conductivity modulated device which has been optimized for use within integrated switch mode power supply applications. The device contains a linearly-graded charge profile in the drift region, and the fast-switching LIGBT can be used at current densities which are at least a factor-of-two greater than the SOI LDMOS of equivalent breakdown voltage (LIGBT BVds 650V/Rsp 4 ohm mm2). A device failure mechanism which occurs during shorted-winding SMPS transients unique to thin-layer devices has been documented, and device protection circuitry has been developed to provide a transient current limit mechanism within the high voltage device. The electrical characteristics of the protected conductivity modulated thin-layer SOI high voltage device are comparable to state-of-the-art discrete components, and as such this process technology provides a monolithic alternative for miniaturization and integration of switch mode power supply topologies\",\"PeriodicalId\":198443,\"journal\":{\"name\":\"2006 IEEE International Symposium on Power Semiconductor Devices and IC's\",\"volume\":\"30 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2006-06-04\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"39\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2006 IEEE International Symposium on Power Semiconductor Devices and IC's\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISPSD.2006.1666145\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2006 IEEE International Symposium on Power Semiconductor Devices and IC's","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISPSD.2006.1666145","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
650V SOI LIGBT for Switch-Mode Power Supply Application
This paper presents a thin-layer high voltage silicon-on-insulator conductivity modulated device which has been optimized for use within integrated switch mode power supply applications. The device contains a linearly-graded charge profile in the drift region, and the fast-switching LIGBT can be used at current densities which are at least a factor-of-two greater than the SOI LDMOS of equivalent breakdown voltage (LIGBT BVds 650V/Rsp 4 ohm mm2). A device failure mechanism which occurs during shorted-winding SMPS transients unique to thin-layer devices has been documented, and device protection circuitry has been developed to provide a transient current limit mechanism within the high voltage device. The electrical characteristics of the protected conductivity modulated thin-layer SOI high voltage device are comparable to state-of-the-art discrete components, and as such this process technology provides a monolithic alternative for miniaturization and integration of switch mode power supply topologies