基于抗辐射闪存的FPGA-RT4G150中SERDES、Fabric触发器和锁相环的单事件效应测试

2016 IEEE Radiation Effects Data Workshop (REDW) Pub Date : 2016-07-11 DOI:10.1109/NSREC.2016.7891741

Jih-Jong Wang, Durwyn Dsilva, N. Rezzak, Stephen Varela, Sean Cui

{"title":"基于抗辐射闪存的FPGA-RT4G150中SERDES、Fabric触发器和锁相环的单事件效应测试","authors":"Jih-Jong Wang, Durwyn Dsilva, N. Rezzak, Stephen Varela, Sean Cui","doi":"10.1109/NSREC.2016.7891741","DOIUrl":null,"url":null,"abstract":"Heavy-ion beam is used to perform Single Event Effects testing on the Flash-based and radiation hardened FPGA, the RT4G150 device. Soft errors due to SEU and SET in the fabric Flip-Flops and PLL generated clocks are measured and analyzed. SEFIs in PLL and SERDES are also observed.","PeriodicalId":135325,"journal":{"name":"2016 IEEE Radiation Effects Data Workshop (REDW)","volume":"241 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-07-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Single Event Effects Testing on the SERDES, Fabric Flip-Flops and PLL in a Radiation-Hardened Flash-Based FPGA-RT4G150\",\"authors\":\"Jih-Jong Wang, Durwyn Dsilva, N. Rezzak, Stephen Varela, Sean Cui\",\"doi\":\"10.1109/NSREC.2016.7891741\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Heavy-ion beam is used to perform Single Event Effects testing on the Flash-based and radiation hardened FPGA, the RT4G150 device. Soft errors due to SEU and SET in the fabric Flip-Flops and PLL generated clocks are measured and analyzed. SEFIs in PLL and SERDES are also observed.\",\"PeriodicalId\":135325,\"journal\":{\"name\":\"2016 IEEE Radiation Effects Data Workshop (REDW)\",\"volume\":\"241 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-07-11\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE Radiation Effects Data Workshop (REDW)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/NSREC.2016.7891741\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE Radiation Effects Data Workshop (REDW)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NSREC.2016.7891741","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 4

摘要

重离子束用于对基于flash的抗辐射FPGA RT4G150器件进行单事件效应测试。对织物触发器和锁相环产生的时钟中SEU和SET引起的软误差进行了测量和分析。在PLL和SERDES中也观察到sefi。

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Single Event Effects Testing on the SERDES, Fabric Flip-Flops and PLL in a Radiation-Hardened Flash-Based FPGA-RT4G150

Heavy-ion beam is used to perform Single Event Effects testing on the Flash-based and radiation hardened FPGA, the RT4G150 device. Soft errors due to SEU and SET in the fabric Flip-Flops and PLL generated clocks are measured and analyzed. SEFIs in PLL and SERDES are also observed.

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来源期刊

2016 IEEE Radiation Effects Data Workshop (REDW)

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