闭合电容:解决开关噪声问题的一种方法

H. Hashemi, P. Sandborn, D. Disko, R. Evans
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引用次数: 19

摘要

作者分析了一种新型的低成本后附加旁路技术,称为闭合附加电容器(CAC),它为管理单芯片或多芯片封装中的开关噪声提供了一种有吸引力的替代方案。CAC是一个薄的扁平电容器,大小与IC芯片相当,放置在芯片的活动表面上,并通过非常短的键连接到片上电源和接地垫。通过将CAC定位在模具的表面,可以避免芯片键和相关的外部引线键垫的电感,并且需要更少的互连面积。已经对CAC工艺进行了一些环境测试,表明当连接到钝化模具的活性表面时,没有器件参数退化。解决了CAC设计问题,并证明了使用传统可修复或永久附加工艺制造高频电容器及其组件的可行性。本文给出了在高性能单芯片封装和多芯片模块上集成CACs的例子,并证明了CACs在降低开关噪声方面的有效性
本文章由计算机程序翻译,如有差异,请以英文原文为准。
The close attached capacitor: a solution to switching noise problems
The authors present an analysis of a novel low-cost, post-attach bypassing technique called close attached capacitor (CAC), which offers an attractive alternative to managing switching noise in single or multichip packages. The CAC is a thin flat capacitor, comparable in size to an IC die, that is placed on the active surface of the die and connected to onchip power and ground pads through very short bonds. By locating the CAC on the face of the die, the inductance of chip bonds and associated outer lead bond pads is avoided and less interconnect area is needed. Some environmental testing of the CAC process has been performed, indicating no device parameter degradation when attachment is made to the active surface of a passivated die. CAC design issues are addressed, and the feasibility of manufacturing high-frequency capacitors and their assemblies using conventional reworkable or permanent attach processes is demonstrated. Examples of the integration of CACs in high-performance single chip packages and to chips on multichip modules are shown, and the effectiveness of CACs in the reduction of switching noise is demonstrated.<>
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