K. Domanski, S. Bargstadt-Franke, W. Stadler, U. Glaser, W. Bala
{"title":"鲁棒产品的开发策略","authors":"K. Domanski, S. Bargstadt-Franke, W. Stadler, U. Glaser, W. Bala","doi":"10.1109/EOSESD.2004.5272595","DOIUrl":null,"url":null,"abstract":"Detailed transient latch-up (TLU) analyses of external test structures show that a DC trigger does not necessarily reflect worst case conditions. Furthermore, the classical guard ring latch-up protection approach fails for transient trigger. In this contribution, design recommendations for TLU-safe designs are presented. The knowledge about the perturbation environment and an appropriate design are essential for a TLU-robust product.","PeriodicalId":302866,"journal":{"name":"2004 Electrical Overstress/Electrostatic Discharge Symposium","volume":"58 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"23","resultStr":"{\"title\":\"Development strategy for TLU-robust products\",\"authors\":\"K. Domanski, S. Bargstadt-Franke, W. Stadler, U. Glaser, W. Bala\",\"doi\":\"10.1109/EOSESD.2004.5272595\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Detailed transient latch-up (TLU) analyses of external test structures show that a DC trigger does not necessarily reflect worst case conditions. Furthermore, the classical guard ring latch-up protection approach fails for transient trigger. In this contribution, design recommendations for TLU-safe designs are presented. The knowledge about the perturbation environment and an appropriate design are essential for a TLU-robust product.\",\"PeriodicalId\":302866,\"journal\":{\"name\":\"2004 Electrical Overstress/Electrostatic Discharge Symposium\",\"volume\":\"58 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2004-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"23\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2004 Electrical Overstress/Electrostatic Discharge Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EOSESD.2004.5272595\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2004 Electrical Overstress/Electrostatic Discharge Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EOSESD.2004.5272595","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Detailed transient latch-up (TLU) analyses of external test structures show that a DC trigger does not necessarily reflect worst case conditions. Furthermore, the classical guard ring latch-up protection approach fails for transient trigger. In this contribution, design recommendations for TLU-safe designs are presented. The knowledge about the perturbation environment and an appropriate design are essential for a TLU-robust product.
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