板上芯片(COB)与板上芯片(BOC)内存封装

Chong Chin Hui, Wang Ai Chie
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引用次数: 0

摘要

由于消费电子领域的激烈竞争,特别是在移动通信产品领域,新的存储产品(包括DRAM和NAND闪存)必须满足更高的速度要求,以更小的外形尺寸封装,并实现更高的密度。因此,必须对最常见的封装类型——用于DRAM的板上芯片(BOC)和用于NAND闪存的板上芯片(COB)——进行分析,以确定它们是否能够满足当前和未来的封装挑战。正在研究的COB和BOC基板的组成是迹线、键指、金属层数和过孔。根据这些基板组件的趋势,未来的基板将需要至少有两个金属层(特别是BOC),使用更窄的键指间距,厚度小于0.13mm,并具有通过陆地/钻孔尺寸小于220μm/100μm的通孔。必须进行进一步的工作,以确定基于现有翘曲规范的最小所需迹线宽度值,以及作为模具长度函数的最小所需键指间距。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Chip on board (COB) versus board on chip (BOC) memory packages
Due to intense competition in the consumer electronics landscape, especially in the mobile communication products sector, new memory products (both DRAM and NAND Flash) must meet higher speed requirements, be packaged in smaller form factors, and achieve higher densities. Therefore, the most common package types-board on chip (BOC) for DRAM and chip on board (COB) for NAND Flash-must be analyzed to determine whether they can meet current and future packaging challenges. The components of COB and BOC substrates that are being studied are traces, bond fingers, the number of metal layers, and vias. Based on the trends of these substrate components, future substrates will be required to have at least two metal layers (BOC in particular), utilize narrower bond finger pitches, be thinner than 0.13mm and have vias with via land/drill hole sizes of less than 220μm/100μm. Further work must be performed to determine the minimum required trace width value based on the existing warpage specifications as well as the minimum required bond finger pitch as a function of die length.
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