{"title":"转换行为规范以促进可测试设计的综合","authors":"S. Dey, M. Potkonjak","doi":"10.1109/TEST.1994.527949","DOIUrl":null,"url":null,"abstract":"Recently, several high level synthesis approaches have been proposed to synthesize testable data paths from behavioral specifications. This paper introduces a novel technique to transform behavioral specifications, such that an existing behavioral test synthesis system can generate area-efficient, testable designs with significantly lower partial scan overhead. Experimental results demonstrate the significant savings in partial scan overhead when the transformation is applied before using the behavioral test synthesis system to synthesize 100% test-efficient designs.","PeriodicalId":309921,"journal":{"name":"Proceedings., International Test Conference","volume":"72 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"40","resultStr":"{\"title\":\"Transforming behavioral specifications to facilitate synthesis of testable designs\",\"authors\":\"S. Dey, M. Potkonjak\",\"doi\":\"10.1109/TEST.1994.527949\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Recently, several high level synthesis approaches have been proposed to synthesize testable data paths from behavioral specifications. This paper introduces a novel technique to transform behavioral specifications, such that an existing behavioral test synthesis system can generate area-efficient, testable designs with significantly lower partial scan overhead. Experimental results demonstrate the significant savings in partial scan overhead when the transformation is applied before using the behavioral test synthesis system to synthesize 100% test-efficient designs.\",\"PeriodicalId\":309921,\"journal\":{\"name\":\"Proceedings., International Test Conference\",\"volume\":\"72 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1994-10-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"40\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings., International Test Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.1994.527949\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings., International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.1994.527949","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Transforming behavioral specifications to facilitate synthesis of testable designs
Recently, several high level synthesis approaches have been proposed to synthesize testable data paths from behavioral specifications. This paper introduces a novel technique to transform behavioral specifications, such that an existing behavioral test synthesis system can generate area-efficient, testable designs with significantly lower partial scan overhead. Experimental results demonstrate the significant savings in partial scan overhead when the transformation is applied before using the behavioral test synthesis system to synthesize 100% test-efficient designs.