{"title":"使用IEEE P1149.4基础架构实现混合电流/电压测试","authors":"J. M. D. Silva, A. C. Leão, J. S. Matos, J. Alves","doi":"10.1109/TEST.1997.639657","DOIUrl":null,"url":null,"abstract":"The development of a mixed-signal test bus infrastructure-IEEE P1149.4-is now in the final stages of the standardization process. Evaluating the test capabilities enabled by this infrastructure is an important step needed to support it as a well established standard. This paper presents experiments carried out with a test chip provided by the P1149.4 working group, which explore the architecture of the proposed analog boundary module to implement alternative testing methods. These include a method for parametric testing of passive components based on the monitoring of the power supply current, and a mixed current/voltage technique allowing the implementation of correlation for testing analog and mixed-signal macros.","PeriodicalId":186340,"journal":{"name":"Proceedings International Test Conference 1997","volume":"116 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-11-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Implementation of mixed current/voltage testing using the IEEE P1149.4 infrastructure\",\"authors\":\"J. M. D. Silva, A. C. Leão, J. S. Matos, J. Alves\",\"doi\":\"10.1109/TEST.1997.639657\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The development of a mixed-signal test bus infrastructure-IEEE P1149.4-is now in the final stages of the standardization process. Evaluating the test capabilities enabled by this infrastructure is an important step needed to support it as a well established standard. This paper presents experiments carried out with a test chip provided by the P1149.4 working group, which explore the architecture of the proposed analog boundary module to implement alternative testing methods. These include a method for parametric testing of passive components based on the monitoring of the power supply current, and a mixed current/voltage technique allowing the implementation of correlation for testing analog and mixed-signal macros.\",\"PeriodicalId\":186340,\"journal\":{\"name\":\"Proceedings International Test Conference 1997\",\"volume\":\"116 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1997-11-03\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings International Test Conference 1997\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.1997.639657\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings International Test Conference 1997","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.1997.639657","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Implementation of mixed current/voltage testing using the IEEE P1149.4 infrastructure
The development of a mixed-signal test bus infrastructure-IEEE P1149.4-is now in the final stages of the standardization process. Evaluating the test capabilities enabled by this infrastructure is an important step needed to support it as a well established standard. This paper presents experiments carried out with a test chip provided by the P1149.4 working group, which explore the architecture of the proposed analog boundary module to implement alternative testing methods. These include a method for parametric testing of passive components based on the monitoring of the power supply current, and a mixed current/voltage technique allowing the implementation of correlation for testing analog and mixed-signal macros.
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
