Takeshi Iwasaki, Masao Aso, Haruji Futami, Satoshi Matsunaga, Yousuke Miyake, Takaaki Kato, S. Kajihara, Y. Miura, Smith Lai, Gavin Hung, Harry H. Chen, Haruo Kobayashi, K. Hatayama
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The IP session highlights three innovative test practices in Asia, which include a testing solution for the millimeterwave (76- to 81- GHz) without expensive instruments, an on-chip delay measurement method for in-field test and a power control method of at-speed scan test for IR violation reduction. These would be useful for automotive and IoT application device testing.
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