{"title":"射频收发器的测试与诊断方法","authors":"Hungkai Chen, C. Su","doi":"10.1109/ATS.2007.29","DOIUrl":null,"url":null,"abstract":"This paper proposes an RF test and diagnosis methodology based on digital DFT structure and built- in DSP function of a SoC Chip. Constellation variation plots are proposed to identify the faulty component. Furthermore, linear interpolation is used to determine the amount of variation. The simulated test results show that the method is able to identify not only the faulty component but also the variation amount precise.","PeriodicalId":289969,"journal":{"name":"16th Asian Test Symposium (ATS 2007)","volume":"52 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-10-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"A Test and Diagnosis Methodology for RF Transceivers\",\"authors\":\"Hungkai Chen, C. Su\",\"doi\":\"10.1109/ATS.2007.29\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper proposes an RF test and diagnosis methodology based on digital DFT structure and built- in DSP function of a SoC Chip. Constellation variation plots are proposed to identify the faulty component. Furthermore, linear interpolation is used to determine the amount of variation. The simulated test results show that the method is able to identify not only the faulty component but also the variation amount precise.\",\"PeriodicalId\":289969,\"journal\":{\"name\":\"16th Asian Test Symposium (ATS 2007)\",\"volume\":\"52 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-10-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"16th Asian Test Symposium (ATS 2007)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ATS.2007.29\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"16th Asian Test Symposium (ATS 2007)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.2007.29","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A Test and Diagnosis Methodology for RF Transceivers
This paper proposes an RF test and diagnosis methodology based on digital DFT structure and built- in DSP function of a SoC Chip. Constellation variation plots are proposed to identify the faulty component. Furthermore, linear interpolation is used to determine the amount of variation. The simulated test results show that the method is able to identify not only the faulty component but also the variation amount precise.