适用于航空电子设备的微电子中子SEE测试结果交叉比对指南

2010 IEEE Radiation Effects Data Workshop Pub Date : 2010-07-20 DOI:10.1109/REDW.2010.5619496

E. Normand, L. Dominik

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引用次数: 32

摘要

使用不同中子/质子束的>30个器件(sram微处理器和fpga)的SEU, SEFI和SEL响应的交叉比较导致观察到14 MeV中子的SEU和SEFI截面与LANL中子束相比在<2以内。

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Cross Comparison Guide for Results of Neutron SEE Testing of Microelectronics Applicable to Avionics

A cross comparison of SEU, SEFI and SEL responses in >30 devices (SRAMs µprocessors and FPGAs) using different neutron/proton beams leads to observation that SEU and SEFI cross sections from 14 MeV neutrons are within <2 compared to LANL neutron beam.

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来源期刊

2010 IEEE Radiation Effects Data Workshop

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