塑料封装中温度循环性能的模型

P. Syndergaard, J. Young
{"title":"塑料封装中温度循环性能的模型","authors":"P. Syndergaard, J. Young","doi":"10.1109/IRWS.1994.515824","DOIUrl":null,"url":null,"abstract":"A requirement for many customers of semiconductors encapsulated in plastic packages is the ability to survive 1000 cycles of air-to-air (gas-to-gas) temperature cycle under the conditions of -65/spl deg/C to +150/spl deg/C. A series of experiments were performed to model the performance of molding compounds relative to die size. The model was then correlated to the historical temperature cycling data of an encapsulant independent of package size or type. The temperature cycle performance can now be predicted based on die size. The package size or type is incidental, a larger package is generally required for a larger die.","PeriodicalId":164872,"journal":{"name":"Proceedings of 1994 IEEE International Integrated Reliability Workshop (IRWS)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-10-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"A model of temperature cycling performance in plastic encapsulated packages\",\"authors\":\"P. Syndergaard, J. Young\",\"doi\":\"10.1109/IRWS.1994.515824\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A requirement for many customers of semiconductors encapsulated in plastic packages is the ability to survive 1000 cycles of air-to-air (gas-to-gas) temperature cycle under the conditions of -65/spl deg/C to +150/spl deg/C. A series of experiments were performed to model the performance of molding compounds relative to die size. The model was then correlated to the historical temperature cycling data of an encapsulant independent of package size or type. The temperature cycle performance can now be predicted based on die size. The package size or type is incidental, a larger package is generally required for a larger die.\",\"PeriodicalId\":164872,\"journal\":{\"name\":\"Proceedings of 1994 IEEE International Integrated Reliability Workshop (IRWS)\",\"volume\":\"7 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1994-10-16\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of 1994 IEEE International Integrated Reliability Workshop (IRWS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IRWS.1994.515824\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of 1994 IEEE International Integrated Reliability Workshop (IRWS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IRWS.1994.515824","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

许多塑料封装半导体客户的要求是能够在-65/spl°C至+150/spl°C的条件下承受1000次空对空(气对气)温度循环。进行了一系列的实验来模拟成型化合物相对于模具尺寸的性能。然后将该模型与独立于包装尺寸或类型的密封剂的历史温度循环数据相关联。温度循环性能现在可以根据模具尺寸来预测。封装尺寸或类型是偶然的,较大的封装一般需要较大的模具。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A model of temperature cycling performance in plastic encapsulated packages
A requirement for many customers of semiconductors encapsulated in plastic packages is the ability to survive 1000 cycles of air-to-air (gas-to-gas) temperature cycle under the conditions of -65/spl deg/C to +150/spl deg/C. A series of experiments were performed to model the performance of molding compounds relative to die size. The model was then correlated to the historical temperature cycling data of an encapsulant independent of package size or type. The temperature cycle performance can now be predicted based on die size. The package size or type is incidental, a larger package is generally required for a larger die.
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