{"title":"基于并发故障仿真的有限状态机功能测试生成","authors":"N. Cooray, E. W. Czeck","doi":"10.1109/ATW.1994.747832","DOIUrl":null,"url":null,"abstract":"This paper presents a new test-sequence generation method for finite state machines at the functional specification level. The test generation algorithm incorporates concurrent functional fault simulation to reduce the length of the generated test sequence and the test generation time. The test sequence generator guarantees 100 % transition fault coverage. We also identified some weaknesses in the transil.ion fault model for finite state machines which results in less than perfect structural fault coverage.","PeriodicalId":217615,"journal":{"name":"The Third Annual Atlantic Test Workshop","volume":"423 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-08-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Functional Test Generation For finite State Machines With Concurrent Fault Simulation\",\"authors\":\"N. Cooray, E. W. Czeck\",\"doi\":\"10.1109/ATW.1994.747832\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a new test-sequence generation method for finite state machines at the functional specification level. The test generation algorithm incorporates concurrent functional fault simulation to reduce the length of the generated test sequence and the test generation time. The test sequence generator guarantees 100 % transition fault coverage. We also identified some weaknesses in the transil.ion fault model for finite state machines which results in less than perfect structural fault coverage.\",\"PeriodicalId\":217615,\"journal\":{\"name\":\"The Third Annual Atlantic Test Workshop\",\"volume\":\"423 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2002-08-06\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"The Third Annual Atlantic Test Workshop\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ATW.1994.747832\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"The Third Annual Atlantic Test Workshop","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATW.1994.747832","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Functional Test Generation For finite State Machines With Concurrent Fault Simulation
This paper presents a new test-sequence generation method for finite state machines at the functional specification level. The test generation algorithm incorporates concurrent functional fault simulation to reduce the length of the generated test sequence and the test generation time. The test sequence generator guarantees 100 % transition fault coverage. We also identified some weaknesses in the transil.ion fault model for finite state machines which results in less than perfect structural fault coverage.
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