{"title":"用2端口网络分析仪表征n端口包和互连","authors":"S. Sercu, L. Martens","doi":"10.1109/EPEP.1997.634062","DOIUrl":null,"url":null,"abstract":"In this paper a technique is described for the measurement of the correct S-parameters of an N-port package or interconnection using a 2-port network analyzer with 50 /spl Omega/ system impedance and N imperfect terminations. The technique is fully general and can be applied using arbitrary terminations. Broadband 50 n loads are not required. The method is illustrated on a coupled microstrip line structure.","PeriodicalId":220951,"journal":{"name":"Electrical Performance of Electronic Packaging","volume":"93 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-10-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"37","resultStr":"{\"title\":\"Characterizing N-port packages and interconnections with a 2-port network analyzer\",\"authors\":\"S. Sercu, L. Martens\",\"doi\":\"10.1109/EPEP.1997.634062\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper a technique is described for the measurement of the correct S-parameters of an N-port package or interconnection using a 2-port network analyzer with 50 /spl Omega/ system impedance and N imperfect terminations. The technique is fully general and can be applied using arbitrary terminations. Broadband 50 n loads are not required. The method is illustrated on a coupled microstrip line structure.\",\"PeriodicalId\":220951,\"journal\":{\"name\":\"Electrical Performance of Electronic Packaging\",\"volume\":\"93 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1997-10-27\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"37\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Electrical Performance of Electronic Packaging\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EPEP.1997.634062\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Electrical Performance of Electronic Packaging","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPEP.1997.634062","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Characterizing N-port packages and interconnections with a 2-port network analyzer
In this paper a technique is described for the measurement of the correct S-parameters of an N-port package or interconnection using a 2-port network analyzer with 50 /spl Omega/ system impedance and N imperfect terminations. The technique is fully general and can be applied using arbitrary terminations. Broadband 50 n loads are not required. The method is illustrated on a coupled microstrip line structure.