砷化镓金属-半导体-金属(MSM)光电探测器的光电模拟

1996 International Conference on Simulation of Semiconductor Processes and Devices. SISPAD '96 (IEEE Cat. No.96TH8095) Pub Date : 1996-09-02 DOI:10.1109/SISPAD.1996.865267

T. Korner, P. D. Yoder, L. Bomholt, W. Fichtner

{"title":"砷化镓金属-半导体-金属(MSM)光电探测器的光电模拟","authors":"T. Korner, P. D. Yoder, L. Bomholt, W. Fichtner","doi":"10.1109/SISPAD.1996.865267","DOIUrl":null,"url":null,"abstract":"A complete optical-electronical simulation of a GaAs based MSM photodetector is presented. In the modeling, rigorous electromagnetic methods for the light propagation have been combined with particle-based Monte-Carlo electronic device simulation methods.","PeriodicalId":341161,"journal":{"name":"1996 International Conference on Simulation of Semiconductor Processes and Devices. SISPAD '96 (IEEE Cat. No.96TH8095)","volume":"46 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1996-09-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Optical-electronic simulation of a GaAs metal-semiconductor-metal (MSM) photodetector\",\"authors\":\"T. Korner, P. D. Yoder, L. Bomholt, W. Fichtner\",\"doi\":\"10.1109/SISPAD.1996.865267\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A complete optical-electronical simulation of a GaAs based MSM photodetector is presented. In the modeling, rigorous electromagnetic methods for the light propagation have been combined with particle-based Monte-Carlo electronic device simulation methods.\",\"PeriodicalId\":341161,\"journal\":{\"name\":\"1996 International Conference on Simulation of Semiconductor Processes and Devices. SISPAD '96 (IEEE Cat. No.96TH8095)\",\"volume\":\"46 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1996-09-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1996 International Conference on Simulation of Semiconductor Processes and Devices. SISPAD '96 (IEEE Cat. No.96TH8095)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SISPAD.1996.865267\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1996 International Conference on Simulation of Semiconductor Processes and Devices. SISPAD '96 (IEEE Cat. No.96TH8095)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SISPAD.1996.865267","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 4

摘要

给出了基于砷化镓的MSM光电探测器的完整光电仿真。在建模中，将光传播的严格电磁方法与基于粒子的蒙特卡罗电子器件仿真方法相结合。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Optical-electronic simulation of a GaAs metal-semiconductor-metal (MSM) photodetector

A complete optical-electronical simulation of a GaAs based MSM photodetector is presented. In the modeling, rigorous electromagnetic methods for the light propagation have been combined with particle-based Monte-Carlo electronic device simulation methods.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

1996 International Conference on Simulation of Semiconductor Processes and Devices. SISPAD '96 (IEEE Cat. No.96TH8095)

自引率

0.00%

发文量